x-ray diffractometer for silicon ingot/wafer
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Catalog excerpts

iimfjstas DAADOAG UflODOnO RADIOACTIVE lAJTRUIAEAT CO..ITD ±5^1111 n> Ht$M»]fir, nJ»j2-1255vt-aBallK> Ht$, K/tSOOmm, ^is]ffig±30" ■& ±15" o as®****, Sftilo It is basic of standard orientation instrument, designed for multiple crystal such as single crystal sil icon, sapphire, gallium arsenide and so on. Mainly used for measurement of circular wafer, crystal bar. It can measures 2-12inch wafer, crystal bar, length of 500mm, orientation precision ±30”or±15” matching with the external type monitor and bearing rail inclusion. Two side angular instruments users can select different model angular instrument according to cry stal dimension and shape. Please select configuration refer to our G series products (GA,GB,GC, GD,GE,GF,GH) .

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