Visoria M upright microscope The Visoria M materials microscope is for routine inspection in the metals, electronics, and polymer industries, as well as for materials science labs. If you already have a DM2500, DM2700 M, or DM2700 P upright microscope, you can upgrade to a Visoria stand without paying the full price of an entirely new microscope. This means you will not need a new stage, objectives, filters, tubes or eyepieces - your current components are fully compatible with Visoria. The Visoria stand is available in either a traditional (eyepieces) or digital configuration. > Save time with optimized light settings. The light management function automatically adjusts brightness when changing magnification or contrast methods. > Operate your microscope with ease - With color-coding quickly match the proper aperture diaphragm and objective, a built-in focus stop helps protect specimens and objectives, and a three-gear system enables finer focusing at higher magnification. > Reduce the risk of discomfort and repetitive strain injury when spending long hours at the microscope, you can minimize repetitive movements with the Visoria series by adjusting the height and torque of the stage control. > The knobs for controlling the XY stage position and focus of the Visoria microscope(s) are in close proximity and easily adjustable with one hand. > The microscope can be easily changed between right-and left-handed operation. Especially beneficial when the microscope is shared with other users. > Simplify your documentation. Image capture with the press of a button and system settings automatically stored with images. The Enersight software platform helps you compare, measure, and share seamlessly with a single intuitive interface. > Observe samples with a larger field of view and higher resolution using the 2D Stitching function. > Acquire sharp images of samples with extended depth of field (EDOF). > Choose your optimal illumination and camera parameters with the Best Image function. > Determine the thickness of coatings using the layer thickness measurement function.

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