Visoria M materials microscope

Experience enhanced efficiency and comfort in your daily microscopy routine. The Visoria M materials microscope is for applications performed in the metal, electronics, and polymer industries as well as for materials science labs. Streamline your workflows with encoded functions, optimized light settings, and other microscope features. You can also be more comfortable and minimize strain thanks to the microscope's ergonomic design. The Visoria M digital material microscope without eyepieces offers a number of practical benefits. Work without eyepieces by going digital > Work in a comfortable...

EFFICIENCY THROUGH ENCODED FUNCTIONS Increase the efficiency of your routine microscopy tasks. Save valuable time with simplified documentation and encoded microscope functionality, allowing you to focus on your sample. Save time with optimized light settings Spend more time viewing and examining samples with Visoria M. If you change the microscope’s magnification or contrast method, there is no need to manually adjust the brightness thanks to the light management function. The illumination settings are automatically applied thanks to the microscope’s encoding. Observe samples with optimal illumination:...

MORE COMFORT WITH ERGONOMICS Work with a comfortable posture by taking advantage of the symmetrical positioning of controls and ergonomic accessories. These features help reduce neck and back strain, even during extended hours at the microscope. Stay comfortable while working Visoria M adapts to your needs, allowing a proper posture and reducing the risk of neck and back strain during long hours at the microscope. Work comfortably with aligned shoulders and ergonomic hand and arm positioning thanks to the symmetrical layout and height adjustment of the focus and stage control knobs. You can operate...

POWERED BY THE ENERSIGHT SOFTWARE PLATFORM Simplify and streamline your workflow with the Visoria M materials microscope and Enersight software platform. It helps you compare, measure, and share data seamlessly with a single intuitive interface. Left: Visoria M digital material microscope with Flexacam i5 camera and Enersight software. Key advantages: > Determine the thickness of coatings or layers using the Layer Thickness Measurement function. > Observe samples with a larger field of view and higher resolution using the XY Stitching with Manual Stage function. > Acquire sharp images of samples...

VISORIA M MATERIALS MICROSCOPE Visoria M is designed for routine inspection concerning quality control, failure analysis, and R&D in the metal, electronics, and polymer industries, as well as for materials science labs. Visualize sample details with the right contrast For industrial and material inspection and R&D, Visoria M allows you to see the details of structures and defects, such as scratches or contamination, on your samples. It uses a variety of contrast methods, including brightfield, darkfield, polarization, differential interference (DIC), oblique illumination, and fluorescence. In...

MICROSCOPE CONTRAST METHODS AND THEIR APPLICATIONS Efficiently visualize and analyze samples of your parts, components, and materials using various contrast methods with the Visoria M materials microscope. You can reveal surface structures with brightfield, darkfield, DIC, polarization, and oblique illumination concerning applications in the electronics, metal, and polymer industries as well as material science. Visoria M can be used for various types of routine inspection tasks related to quality control, failure analysis, and R&D. Brightfield (BF) Perform measurements of sample features using...

Electronics Elevate your routine inspection process for quality control in the electronics industry with the Visoria M materials microscope. Harness the power of multiple contrast techniques, including brightfield, darkfield, oblique illumination, differential interference contrast (DIC), and polarization. These methods allow you to see the details with clarity when examining PCBs, microchips, and microelectronic assemblies. You can detect small defects and irregularities on product samples with Visoria M, helping you to streamline your inspection processes and ensure high quality standards.

Materials and metals Visoria M helps you perform routine inspection for applications concerning materials and metals. It enables the detection and localization of specific sample structures and defects. For the detection and documentation of macro structures, the 0.7x Macro objective helps you obtain a large overview of the sample. Easily switch between different magnifications and contrast methods to visualize the important structures on your samples for quality control and failure analysis. Aluminum alloy, 50x, BF Welded layers, 0.7x Macro objective, BF Cross section of coated thread, 50x,...

Composite materials Unlock the full potential of composite materials, known for their superior strength and lightweight properties, with Visoria M. This microscope is designed for routine inspection and quality control. Visoria M offers various contrast techniques which help reveal intricate details and fine defects during inspection, ensuring that the materials meet your quality standards. Composite material, 10x, polarization

MC-0010391 • 19.02.2025 • EN • Copyright © 2025 by Leica Microsystems GmbH. LEICA and the Leica Logo are registered trademarks of Leica Microsystems IR GmbH Leica Microsystems GmbH | Ernst-Leitz-Strasse 17-37 | D-35578 Wetzlar (Germany) Tel. +49 (0) 6441 29-0 | F +49 (0) 6441 29-2599