Leica Map Start Surface imaging and Metrology Software. The Extension for Leica Application Suite Living up to Life MICROSYSTEMS
Open the catalog to page 1Industry-Standard Surface Imaging and Analysis Leica Map Start is the entry level software package of the Leica Map series and is used for viewing and analyzing surface geometry and surface texture. Capabilities include visualization of all the features of measured surfaces, characterization of basic surface features including distances, angles and step heights, and calculation of surface texture parameters. There is a wide range of optional modules for cases in which more advanced surface analysis is required. Powered by industry-standard Mountains Technology®, Leica Map Start builds detailed...
Open the catalog to page 2See More Detail with Simultaneous Image Views Leica microscopes with motorized f ocus drives are capable of generating height maps of surface topography, true color images and intensity images. Using the Leica Map Start software you can manipulate topography, color and intensity images simultaneously, for example when zooming in on a surface feature, or independently, for example when characterizing the surface texture of the surface topography. In addition you can fly over a surface following a predefined flight plan and even, with the 3D view of extended focus colour image 4D Analysis option,...
Open the catalog to page 3Height and bearing ratio parameters Surface after form removal Step height measurements Optional modules, in particular Basic Surface Texture, Contour Analysis and Advanced Contour Analysis, provide additional tools for the analysis of surface geometry and texture if required. Leica Map Start contains a basic set of tools for characterizing surface geometry. It calculates distances and angles on surfaces and profiles (multi-point vertical cross-sections) and calculates step heights on profiles. Height and functional bearing ratio parameters are calculated in accordance with the new ISO 25178...
Open the catalog to page 4Traceability Combined with Interactivity In Leica Map Start a surface analysis document is built visually, frame by frame. Every step in the analysis – for example the generation of a 3D image, an analytical study of surface geometry or texture, the insertion of a measurement identity card – is recorded in a hierarchical analysis workflow that shows the dependencies between steps and provides full metrological traceability. Leica Map Start is fully interactive. Any step in the workflow can be fine-tuned – for example the location of a profile that has been extracted from a surface can be changed...
Open the catalog to page 5Ideal Partners – LAS Montage and Leica Map A series of image planes at known spacing covering the in focus region of a specimen are acquired by LAS Montage in conjunction with a Leica microscope. From this stack a depthmap and an extended focus image are derived. These images are analyzed automatically by applying an existing Leica Map Start analysis document as a template. In routine environments, the template can be prepared by a metrologist and protected against modification by non-authorized staff. The analysis workflow in the template document is applied automatically to each measurement...
Open the catalog to page 6Further Analysis of Surface Texture The Basic Surface Texture optional module provides additional features for the analysis of surface texture. Geometrical studies include the calculation of areas of peaks and valleys on vertical cross-sectional profiles, volumes of bumps and holes, and step heights between zones on surfaces (for example in the assessment of layered electronic and mechanical components, MEMS and electronic circuit boards). Cross-section profile measure area under mean surface Calculation of volume of a manually defined hole Coplanarity of contact zones on an electronic component...
Open the catalog to page 7The Grains & Particles optional module detects and analyzes grains, particles and islands (collectively referred to as "grains") and motifs. Grains are separated from the background on the horizontal plane using binarization techniques. Statistics are generated for all grains, a sub-set of grains or individual grains (area, perimeter, diameter, form factor, aspect ratio, roundness, orientation, etc.). Grains can be sorted into subsets with respect to a threshold value on any parameter. This grain topography can be viewed independently from the background. Grains can also be analyzed on the vertical...
Open the catalog to page 8Contour Analysis, Spectral Analysis, 4D Analysis and Stitching Extended focus image of component Horizontal contour dimensions using Advanced Contour Analysis option Contour Analysis 3D Fourier Analysis, 4D Analysis and Surface Stitching There are two optional modules for contour analysis, the dimensional analysis of component geometry on cross-sectional profiles extracted from the surface. The 3D Fourier Analysis optional module is used to filter noisy images and to eliminate specific frequencies by directly editing the FFT and provides tools for spectral analysis. The Contour Analysis module...
Open the catalog to page 9Instrument compatibility ► The Leica Map Start software is dedicated to Leica microscopes, macroscopes and stereo-microscopes with motorized focus controls and requires LAS Montage software to be installed. PC requirements ► Recommended minimum: Windows 7 or Vista; 4 GB RAM; multi-core processor; 1280x1024 or higher graphics resolution in 32-bit colors. 250 MB disk space; OpenGL accelerated graphics board; USB port for hardware protection key. Desktop publishing environment ► Build a detailed visual metrology report frame by frame in an intuitive desktop publishing environment, working in onscreen,...
Open the catalog to page 10Basic Surface Texture ► Level surfaces and profiles. ► Calculate the area of peaks and valleys and the volume of bumps and holes. ► Calculate the material/void composition and thickness of up to three vertical surface slices. ► Subtract one surface from another (wear). ► M easure step heights on surfaces. ► Apply ISO 16610 advanced roughness/waviness filtering techniques (robust Gaussian and spline filters). ► Calculate ISO 4287 primary and roughness parameters. Grains & Particles ► Detect grains and particles and separate them from the background on the horizontal axis; generate statistics on...
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