Group: DANAHER
Catalog excerpts
LAS X 2D ANALYSIS: Versatile, automated, multi-sample measurements Sample classification trainable for your specific needs The LAS X 2D Analysis module is specifically developed to combine high accuracy sample feature and area measurements with high flexibility so that automated analyses can be tailored to your particular needs. A quick and easy to learn workflow guides you through the individual analysis steps. Various samples and their features, such as particles, powders, fibers, voids, porosity and more, can be analyzed according to geometrical and morphological properties and also according to physical properties like intensity or color. The identified samples or features can be classified based on all the parameters available in the LAS X 2D Analysis software. Beyond this traditional classification, this software also provides a "trainable classifier", i.e. customized classification. Simply select a few samples or features of one or more different classes with a mouse click and 2D Analysis can determine all parameters relevant for classification automatically. Once the specific classifiers are defined, user interaction for future analysis is reduced to a minimum. Additional analysis capability can be achieved by creating dedicated report templates. The available Excel-based report templates provided with the LAS X 2D Analysis module can be easily customized. Some example use cases: > Count and analyze objects such as particles, fibres, pores etc. > Classify objects by size, area, morphology or color > Automated simultaneous classification of different object types by trainable classifier
Open the catalog to page 1Sample classification trainable for your specific needs Sample Preparation Sample selection according to a standardized sampling process. Preparation of clean and even surfaces using abrasives and diamond paste. Etching Chemical or physical visualization of sample features and regions of interest by localized, material specific reagents. Your benefit: Multichannel add-on for advanced analyses 09/2017 · © 2017 by Leica Microsystems CMS GmbH. Subject to modifications. LEICA and the Leica Logo are registered trademarks of Leica Microsystems IR GmbH The additional add-on to 2D Analysis, LAS X...
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