Group: DANAHER
Catalog excerpts
DM8000 M DM12000 M See More, Detect Faster – High-throughput Inspection Syst
Open the catalog to page 1The New Class of Inspection Systems Inspection, process control and defect analysis of wafers or LCDs and TFTs has to be fast, accurate and ergonomic. Leica Microsystems has many years of experience in developing inspection systems for the semiconductor industry. Using this expertise, we have developed a totally new line of products for the inspection of 8 and 12 inch wafers. The Leica DM8000 M and Leica DM12000 M optical inspection systems provide an innovative yet cost-effective system solution for mastering present and future inspection challenges with confidence. More image information...
Open the catalog to page 2Larger field for faster inspection The Leica DM8000 M and the Leica DM12000 M feature an integrated macro mode, giving you four times the field of view of conventional scanning objectives. Seeing more means faster throughput. Top resolution from every angle The new Oblique UV (OUV) mode combines oblique illumination with UV light, which enables you to view a sample in top resolution from any angle - and enhances the accuracy of the inspection results. Higher quality due to ergonomic design An ergonomic design enables users to work in comfort, enhancing their performance and ultimately...
Open the catalog to page 3From Macro to Micro – Defects Don’t Stand a Chance See four times more To detect macro defects, the Leica DM8000 M and DM12000 M have a micro/macro mode for rapid scanning of large components. The macro magnification captures an object field of approximately 40 mm – that’s almost four times more than with conventional scanning objectives. The entire scan area can be accurately scanned for possible defects in a fraction of the time. New contrasting techniques for ultra-high resolution Oblique illumination is an indispensable tool for examining sides, edges or chipping, whereas UV light is...
Open the catalog to page 4For the Demanding Production Environment Keep the environment clean LED illumination is integrated with the Leica DM8000 M/ DM12000 M. You’ll notice the effect of this smart design on your working environment: Without a lamphousing to get in the way, there is an optimal airflow around the microscope. A clean solution for the cleanroom. The powerful LEDs have an extremely long lifetime yet extremely low power consumption. There is no need for lamp change, and there are no downtimes for servicing. Help the environment while saving money and increasing productivity at the same time. The...
Open the catalog to page 5Perfect Ergonomics and Convenience Ergonomics means higher quality It has been proven that ergonomically-designed workplaces help increase productivity and enhance work quality. Adaptable to any user with its individually adjustable Ergotube and height-adjustable focus knobs, the Leica DM8000 M/DM12000 M is ideal for routine inspection and other applications. Easy to use, even in the cleanroom Designed to the highest ergonomic standards, the controls are specifically intended for the more difficult conditions in the cleanroom. All controls are easy to reach, so that users don’t have to take...
Open the catalog to page 6Can be delivered in cleanroom packaging (two-layer packaging) on request.
Open the catalog to page 7LEICA and the Leica Logo are registered trademarks of Leica Microsystems IR GmbH. Copyright © by Leica Microsystems CMS GmbH, Wetzlar, Germany, 2020 · Subject to modifications Leica Microsystems CMS GmbH | Ernst-Leitz-Strasse 17–37 | D-35578 Wetzlar (Germany)
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