THICKNESS TESTER
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THICKNESS TESTER - 1

table.main {} tr.row {} td.cell {} div.block {} div.paragraph {} .font0 { font:11.00pt "Franklin Gothic Medium", sans-serif; } .font1 { font:14.00pt "Franklin Gothic Medium", sans-serif; } .font2 { font:19.00pt "Franklin Gothic Medium", sans-serif; } .font3 { font:7.00pt "Impact", sans-serif; } .font4 { font:47.00pt "Impact", sans-serif; } PARAM* CHY-CAThickness Tester Labthink PARAM CHY-CA Thickness Tester is designed for the prcise thickness measurement of plastic films, sheets. dlaphragms, paper. foils, siiicon wafers and other matriels. Features Micro-computer control, LCD display Menu interface. PVC op驩ration panel Contact type measurement Automatic rise-and-fail measurlng head Automatic spcimen feedlng Automatic and manual testing modes Real-time data display. automatlc statistical analysis Maximum, minimum, average value and statistical error dtsplay The spcimen feedlng interval. the number of testing points and the testing speed can be set Standard contact area. standard testing pressure (non-standard pressure made to order) R驩frence measurement calibration RS232 port Network transmission interface for LAN data management and Internet data transmission Technical Indexes Testing range: 0-2mm 0-6mm; 12mm (optional) Resolution: O.lpm Test pressure: 17.5±1kPa (film): 50±1kPa (paper) Contacting area: SOmrrf (film); 200mm'1 (paper) Note: select one from either film or paper; non-standard requests can be customized. Spcimen feeding interval: 0-1000mm Sp驩cimen (eeding speed: 0,1-*99,9mrrVs Power AC 220V 50Hz Dimensions: 461mm(L)*334mm(B)*357mm(H) Net weight: 32kg Standards ISO 4593. ISO 534. ISO 3034. ASTM D645. ASTM D374. ASTM D1777. TAPPI T411. DIN 53105. DIN 53353. JIS K6250. JIS K6328, JIS K6783. JIS Z1702, BS 3983. BS 4817. GBfT6672. GB/T 451.3. GB/T6547 Configuration Standard: mainframe. standard gauge block Optional: software, communication cable, measuring head. weight (made to order) UbUilnl insrrumpiiK to . Il* No 144 Wuyinqshjn fioad. jln.in «001. Chln* wvw Ubttilnk en TU, 0Q86 SBI 85824157 m> 008* SϮl 8S8iei40

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