THICKNESS TESTER

THICKNESS TESTER

Product catalog summary
Overview: The PARAM CHY-CA Thickness Tester by Labthink Instruments Co., Ltd. is designed for precise measurement of thickness in materials such as plastic films, sheets, diaphragms, paper, foils, and silicon wafers.
Features:
  • Micro-computer control with LCD display and menu interface.
  • PVC operation panel with contact type measurement.
  • Automatic rise-and-fall measuring head and specimen feeding.
  • Supports both automatic and manual testing modes.
  • Real-time data display with automatic statistical analysis including maximum, minimum, average values, and statistical error.
  • Customizable specimen feeding interval, number of testing points, and testing speed.
  • Standard contact area and testing pressure, with options for non-standard pressure.
  • Reference measurement calibration and RS232 port for data management.
  • Network transmission interface for LAN and Internet data transmission.
Technical Specifications:
  • Testing range: 0~2mm, 0~6mm; 12mm (optional).
  • Resolution: 0.1μm.
  • Test pressure: 17.5±1kPa for film, 50±1kPa for paper.
  • Contacting area: 50mm² for film, 200mm² for paper.
  • Specimen feeding interval: 0~1000mm.
  • Specimen feeding speed: 0.1~99.9mm/s.
  • Power: AC 220V 50Hz.
  • Dimensions: 461mm(L)×334mm(B)×357mm(H).
  • Net weight: 32kg.
Standards Compliance: The device complies with various international standards including ISO 4593, ISO 534, ASTM D645, and others.
Configuration:
  • Standard configuration includes the mainframe and standard gauge block.
  • Optional accessories include software, communication cable, measuring head, and custom weights.
See more

Catalog excerpts

THICKNESS TESTER-1

table.main {} tr.row {} td.cell {} div.block {} div.paragraph {} .font0 { font:11.00pt "Franklin Gothic Medium", sans-serif; } .font1 { font:14.00pt "Franklin Gothic Medium", sans-serif; } .font2 { font:19.00pt "Franklin Gothic Medium", sans-serif; } .font3 { font:7.00pt "Impact", sans-serif; } .font4 { font:47.00pt "Impact", sans-serif; } PARAM* CHY-CAThickness Tester Labthink PARAM CHY-CA Thickness Tester is designed for the prcise thickness measurement of plastic films, sheets. dlaphragms, paper. foils, siiicon wafers and other matriels. Features Micro-computer control, LCD display Menu interface. PVC op驩ration panel Contact type measurement Automatic rise-and-fail measurlng head Automatic spcimen feedlng Automatic and manual testing modes Real-time data display. automatlc statistical analysis Maximum, minimum, average value and statistical error dtsplay The spcimen feedlng interval. the number of testing points and the testing speed can be set Standard contact area. standard testing pressure (non-standard pressure made to order) R驩frence measurement calibration RS232 port Network transmission interface for LAN data management and Internet data transmission Technical Indexes Testing range: 0-2mm 0-6mm; 12mm (optional) Resolution: O.lpm Test pressure: 17.5±1kPa (film): 50±1kPa (paper) Contacting area: SOmrrf (film); 200mm'1 (paper) Note: select one from either film or paper; non-standard requests can be customized. Spcimen feeding interval: 0-1000mm Sp驩cimen (eeding speed: 0,1-*99,9mrrVs Power AC 220V 50Hz Dimensions: 461mm(L)*334mm(B)*357mm(H) Net weight: 32kg Standards ISO 4593. ISO 534. ISO 3034. ASTM D645. ASTM D374. ASTM D1777. TAPPI T411. DIN 53105. DIN 53353. JIS K6250. JIS K6328, JIS K6783. JIS Z1702, BS 3983. BS 4817. GBfT6672. GB/T 451.3. GB/T6547 Configuration Standard: mainframe. standard gauge block Optional: software, communication cable, measuring head. weight (made to order) UbUilnl insrrumpiiK to . Il* No 144 Wuyinqshjn fioad. jln.in «001. Chln* wvw Ubttilnk en TU, 0Q86 SBI 85824157 m> 008* SϮl 8S8iei40

 Open the catalog to page 1

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Archived catalogs

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  2. C306H

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  3. C230H

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  4. Leak Tester

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.