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Contacting Thickness Measuring Instrument
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Catalog excerpts

Contacting Thickness Measuring Instrument - 1

www.labthink.cn/en Contact: (Ms) Yarina Gao Email: trade5@labthink.cn Tel: 86-531-85060139 CHY-CA Thickness Measuring Instrument A thickness measuring instrument can be used to accurately measure the thickness of materials such as paper, film, tissue and textiles. Labthink CHY-C2 Thickness Tester utilizes the most advanced technology to quickly and accurately measure the thickness of sheeted materials. CHY-C2 Thickness Measurement Instrument is designed based on the mechanical contacting method, which effectively ensures standard and accurate test data and applicable to thickness test of plastic films, sheets, diaphragms, paper, foils, silicon wafers and other materials within specified range. CHY-C2 Thickness Measurement Instrument has the following unique characteristics to make sure the results more accurate: Based on mechanical contacting method Automatic lifting presser foot facilitates to minimize system errors that caused by human factors during the test Manual or automatic operating mode for convenient test Equipped with standard block for system calibration to ensure uniform and accurate test data The instrument is controlled by micro-computer with LCD display, PVC operation panel and menu interface Equipped with RS232 Display the real-time data of maximum, minimum, average and standard deviation value for data analysis

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Contacting Thickness Measuring Instrument - 2

www.labthink.cn/en Contact: (Ms) Yarina Gao Email: trade5@labthink.cn Tel: 86-531-85060139 Technical Specifications Specifications CHY-C2 Pendulum Capacity 0~2 mm (standard) 0~6 mm, 12 mm (optional) Resolution 0.1 μm Test Pressure Contact Area 17.5±1 KPa (film) 50±1 KPa (paper) 50 mm2 (film) 200 mm2 (paper) Note: Select one presser foot for film or paper; Customization is available Instrument Size 300 mm(L) x 275 mm(W) x 300mm(H) Power Supply AC 220V 50Hz Net Weight 33 Kg Standards ISO 4593 -- Plastics -- Film and sheeting -- Determination of thickness by mechanical scanning ISO 534 --...

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