TOS7210S PID Insulation Tester
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SAFETY TESTER (Potential Induced Degradation) Capable of setting within the range of 50 Vdc to 2000 Vdc (resolution 1 V) Ability to switch the applied voltage polarity instantly by the switch on the front panel The output is floating from the ground potential. Capable of measuring the current value between measurement points.

'Potential Induced Degradation The PID insulation tester (TOS7210S) is designed based on the insulation resistance tester (TOS7200) to carry out the evaluation of the PID (Potential Induced Degradation) effect of the PV module precisely and efficiently. Being equipped with the output ability of 2000 V and the ammeter with nA resolution as well as a polarity switching function, the TOS7210S is also applicable not only to the PID evaluation but also the evaluation of the insulators that requires a high sensitivity of measurement. The tester is equipped with the panel memory that is externally...

PID effect The PID effect is a phenomenon that the amount of power generation by a cell remarkably decreases when high voltage is applied between the solar cell and the frame for long hours. It is supposed that the higher the applied voltage is and/or the higher and more humid the environment is, the further deterioration accelerates. For example, the potential difference in the string becomes extremely higher when the number of sheets that are connected in series increases even if the output voltage of the crystalline silicon solar cell module is just tens of volts. On the other hand, the...

Information related to PID test Reference: National Institute of Advanced Industrial Science and Technology The experiment to reproduce the PID effect was conducted as the collaborative research theme in "Stage II Consortium of high-reliability PV module development and evaluation" that was established in April 2011 by the Research Center of Photovoltaic Technologies, National Institute of Advanced Industrial Science and Technology (hereinafter called "AIST"). Kikusui Electronics Corp. developed TOS7210S as a necessary test equipment contributed for this experiment project. *The contents...

Information related to PID test Reference: National Institute of Advanced Industrial Science and Technology n Confirmation of the deterioration by EL (electro-luminescence) The normal part emits light perfectly, but as the deterioration accelerates, the shaded area increases eventually and ceases to emit light. This method is adopted useful to confirm the PID effect. In addition, it is admitted that the deterioration in the PID effect is reduced with the elapled time by a reversible effect or recovered nearly to the initial state. Normal (recovered) Reversible effect (exposed indoor) n...

/ Specifications Output section Output voltage range Maximum rated output Maximum rated current Output Output type terminals Isolation voltage Maximum rated load Floating ± 1000 Vdc (The terminal that polarity is set to positive polarity) + 1000 Vdc and -3000 Vdc (The terminal that polarity is set to negative polarity) Voltage regulation 1 % or less (Maximum rated load gNo load) Short-circuiting current 2 mA or less (Instant 200 mA or less) Output rise time Discharge function Forced discharge at the end of test (discharge resistance: 20 kΩ) Voltmeter Measurement range Resistance meter...

/ Specifications SIGNAL I/O Input specifications D-SUB 25-pin connector on the rear panel High-level input voltage Low-level input voltage Low-level input current All input signals are active Low controlled. The input terminal is pulled up to +12 V using a resistor. Opening the input terminal is equivalent to inputting a high-level signal. Output method Open collector output (4.5 Vdc to 30 Vdc) Output withstand voltage Output saturation voltage Maximum output current Output specifications Input time width Outputs the measured resistance, measured current and voltage, and current range in DC...

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