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Paving the Way for Research and Innovations

Paving the Way for Research and Innovations
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Paving the Way for Research and Innovations - 1

AGILENT & ACADEMIA Agilent Technologies

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Introduction Research often goes beyond scientific discovery to become the discovery of new sciences. As you develop hypotheses, new theorems and theories to expand the world’s knowledge, confidence in measurements is paramount. In research laboratories around the world, Agilent instrumentation and partnership has become an integral part of advanced experimental systems. As the world’s premier measurement company, Agilent works in close collaboration with engineers, scientists, and researchers around the globe to meet the communications, electronics, life sciences, material sciences and...

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Materials Measurement University of Washington’s Applied Physics Laboratory and Center for Process Analytical Chemistry, are working on new sensors to monitor carbon nano-tube sonication. Utilizing Agilent’s PNA Series Network analyzer and the 85070E Dielectric Probe Kit for complex permittivity measurements, researchers have developed a principle component analysis to categorize single and double walled carbon nano-tubes in a solution. From meta-materials to dielectric substrates, microwave food products to bio-fuels, accurate characterization of electromagnetic properties at RF, microwave...

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Device Characterization in TeraHertz Interest in terahertz is accelerating since many materials exhibit unique terahertz frequency-range properties that provide high contrast for imaging and spectroscopic materials identification. There also is a need for measurement equipment to be expanded into the terahertz region not only to support these applications but also to measure devices that, due to Moore’s law, are rapidly pushing up toward 1 THz and beyond. From detecting cancer tumors to inspecting semiconductors, terahertz measurements are gradually increasing. Directly Connected PNA-X...

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Millimeter-wave Measurements Agilent Technologies and the University of Texas at Dallas established a leading millimeter-wave and sub-millimeter-wave electronics characterization facility at the Texas Analog Center of Excellence (TxACE). The facility will be available to industrial and government institutions using an open, collaborative framework. “With a facility of this type in a university environment, critical barriers will be removed for research in this challenging measurement area.” Ken O - Director of TxACE and holder of the Texas Instruments Distinguished Chair at UT Dallas....

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X-Series Signal Analyzers (PXA and EXA) The PXA and EXA X-Series signal analyzers measure signals from 3 Hz up to 1.1 THz with external frequency extenders. Advanced performance, flexibility, capability and expandability address demanding applications in research, commercial communications and more. Microwave Analog and Vector Signal Generators Agilent offers a broad selection of microwave signal generators with basic to advanced functionality, each delivering benchmark performance in its class. Vector models offer modulation bandwidths > 2 GHz. • PSG models offer metrology-grade...

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RF and Communications X-Series measurement applications Enabling the development of devices and networks is the creation of new wireless communication standards and waves of continuous improvement to existing standards. As such, Agilent actively participates in the development of test processes and measurement methods in many of the wireless connectivity standards. We are determined never to let test equipment needs stand in your way of developing innovative products and technology for evolving wireless standards. • Library of more than 27 measurement applications; transportable between...

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Electronic Design Automation (EDA) software • Advanced Design System (ADS) is the industry’s leading RF, microwave and high speed digital electronic design automation software with integrated MoM-, FEM- and FDTD-based EM simulation • SystemVue enables system architects and algorithm developers to innovate the physical layer (PHY) of next-generation communications systems • Agilent’s Device Modeling tools provide complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation...

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Network analyzers – ENA or PNA-X Series • Perform comprehensive network analysis for WiMAX component needs • Integrate measurements for active devices with minimum iterations • Attain accurate measurements with fast sweep speeds, wide dynamic range and low trace noise Signal generators (signal sources) • Widest selection of baseband, RF and microwave models with basic to advanced functionality, from baseband to 67 GHz • PSG Series offer the lowest phase noise and highest bandwidth • MXG and EXG X-Series offer best-in-class performance and low cost of ownership • Generate LTE, 802.11ac, GNSS...

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When your next discovery is within reach, getting there first — and getting a glimpse of what others haven’t seen — depends on accurate, efficient nanotech measurement tools. Agilent’s nanotech portfolio lets you image, manipulate and characterize a wide variety of nano-scale behaviors — electrical, chemical, biological, molecular, atomic and more. Our growing collection of instruments, accessories, software, services and consumables can reveal the clues you need to understand the nanoscale world. Agilent 7500 Atomic Force Microscope The Agilent 7500 AFM/SPM establishes new performance,...

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U9820A G200 Nano-Indenter Most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters). Applications include semiconductor, thin films, and MEMs (wafer applications); hard coatings and DLC films; composite materials, fibres, and polymers; metals and ceramics; and biomaterials and biology. 81150A and 81160A Pulse Function Arbitrary Noise Generators Accurate and repeatable measurements, small...

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