Lightwave - Test and Measurement Networks and Data Centers
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Lightwave - Test and Measurement Networks and Data Centers - 1

Keysight Technologies Lightwave Catalog Keysight Technologies Lightwave Catalog 2017 2018 Test & Measurement Test & Measurement Networks and Data Centers Networks and Data Centers Keysight M8040A 64 GBaud High-Performance BERT Keysight M8040A 64 GBaud High-Performance BERT Bit Error Ratio Testers – Bit Error Ratio Tester (BERT) – Digital Communication Analyzer (DCA) Digital Communication Analyzers – Tunable Laser Source (TLS) Tunable Laser Sources – Optical Power Meter Optical Power Meters – Wavelength Meter – Optical Attenuator and Wavelength Meters Switch – Polarization and PER Analyzer Optical Attenuators and Switches – Optical Modulation Analyzer (OMA) Polarization Controllers – Lightwave Component Analyzer (LCA) Polarization and PER Analyzers – Arbitrary Waveform Generator (AWG) – Oscilloscope Optical Modulation Analyzers – Digital Interconnect Test System (PLTS) Lightwave Component Analyzers – Application Briefs Arbitrary Waveform Generators – Application Software Oscilloscopes Digital Interconnect Test System Application Br

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Lightwave - Test and Measurement Networks and Data Centers - 3

Introduction by Dr. Joachim Peerlings Keysight in Digital and Photonic Test Let me emphasize five product and solution innovations, which might be of interest to you. N1076B/78A Clock Recovery up to 64 GBaud Accurate clock recovery solutions for high-speed applications up to 64 GBaud supporting NRZ and PAM4 signals. M8040A 64 Gbaud High-Performance BERT The Keysight M8040A is a highly integrated BERT for physical layer characterization and compliance testing. It supports PAM-4 and NRZ signals and data rates up to 64 Gbaud covering all flavors of 200 and 400 GbE standards. The M8040A BERT...

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Lightwave - Test and Measurement Networks and Data Centers - 4

Introduction & New Product Announcements Introduction by Dr. Joachim Peerlings 03 Application Briefs 81606A Tunable Laser Source - a Look Inside 06 Optical Transient Measurements 08 Swept-Wavelength Optical Measurement Solutions 09 Wavelength and Polarization Characterization of Optical-to-Electrical Components 10 Choosing a Detector for Power Measurement of 850 nm Signals 12 Wavelength and Polarization Dependence of 100G-LR4 Components 14 Optical Receiver Stress Test 16 Optical Modulation Analysis Tools 19 Coherent Transmitter and Modulator Test 20 Research on...

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Lightwave - Test and Measurement Networks and Data Centers - 5

Lightwave Component Analyzer (LCA) N4373E Lightwave Component Analyzer (Single-Mode) 69 N4374B Lightwave Component Analyzer (Single-Mode) 70 N4375D Lightwave Component Analyzer (Single-Mode) 71 N4376D Lightwave Component Analyzer (Multimode) 72 Optical Modulation Analyzer (OMA) & ICR Test M8290A Optical Modulation Analyzer and High-speed Digitizer Test Solution 73 N4391A Optical Modulation Analyzer 74 Infiniium Z-Series Oscilloscopes (part of N4391A systems) 75 N4392A Portable Optical Modulation Analyzer 76 Optical Modulation Analyzer Selection Table 78 Infiniium...

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Lightwave - Test and Measurement Networks and Data Centers - 6

81606A Tunable Laser Source - a Look Inside www.keysight.com/find/81606 The new 81606A is the top of our tunable laser family, with a new level of performance for rapid wavelength dependent measurements. –– More than 10 mW signal power with even lower spontaneous emission background –– Better wavelength accuracy, repeatability and resolution at all sweep speeds –– Faster maximum sweep speed and shorter acceleration zones at sweep endpoints –– Bidirectional measurement sweeps For results in practice, this brings: The multi-axis dynamic control during sweeps and the resulting wavelength...

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Lightwave - Test and Measurement Networks and Data Centers - 7

81606A Tunable Laser Source - a Look Inside www.keysight.com/find/81606 Our innovative technology is supported by the mature experience and continuous research in our calibration and test procedures, which allow a statistically solid and traceable basis for confidence in our published specifications. Keysight 81606A - Designed for Best Accuracy Spectral loss testing on up to 8 channnels in a single box The 81606A Tunable Laser Source module in an 8164B Lightwave Measurement System mainframe, plus up to four dual power sensor modules, is sufficient for 8-channel devices, such as a CWDM...

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Lightwave - Test and Measurement Networks and Data Centers - 8

Applications Optical Transient Measurements www.keysight.com/find/mppm Making transient optical power measurements with the N77-Series multiport optical power meter Measuring optical power level changes, to determine fiberoptic switching times or to observe transient fluctuations from fiber movement or network reconfiguration, goes beyond the design of most fiberoptic power meters. These instruments are generally designed for calibrated determination of optical power levels that are constant or change in synchronization with other instruments. The typical sample rates like 10 kHz, data...

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Lightwave - Test and Measurement Networks and Data Centers - 9

Applications Swept-Wavelength Optical Measurement Solutions Swept-wavelength measurement solutions Tunable laser instruments are used for spectral measurements of optical components and materials. The wavelength dependence is rapidly determined with selectable and very high wavelength resolution. The measurement systems can be flexibly configured to match the requirements of the application. Here we suggest some examples. Insertion loss measurement (IL) Combining one or more optical power meters with the tunable laser source (TLS) permits measurement of optical power vs. wavelength. Often...

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Lightwave - Test and Measurement Networks and Data Centers - 10

Applications Wavelength and Polarization Characterization of Optical-to-Electrical Components www.keysight.com/find/n7700 From the swept-wavelength measurement of the input optical power and the output diode current, the responsivity spectra are calculated as the average vs. state of polarization. The maximum and minimum responsivity vs. SOP are also determined, which is especially useful for polarizing components like ICR for polarization. multiplexed signals. The polarization dependence is also displayed as PDL and the TE/TM traces are also calculated, as for optical-optical measurements....

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Lightwave - Test and Measurement Networks and Data Centers - 11

Applications All-states Method for PDL and PER All-states method for PDL and PER The all-states PDL method for measuring polarization dependent loss by scanning the polarization of light input to the DUT over a large sampling of all possible states is a good way to measure components with little wavelength dependence, so that the wavelength can be fixed during the scanning. Fiberoptic couplers, splitters and isolators are typical components to test this way. Tests of polarization beam splitters and other devices designed for high PER also benefit from this method, because it samples the...

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