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Lightwave Catalog: General Photonic Test 2013 Volume 1

Lightwave Catalog: General Photonic Test 2013 Volume 1
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LIGHTWAVE CATALOG General Photonic Test

Agilent Technologies Lightwave Catalog 2013 Introduction by Juergen Beck www.agilent.com/find/lightwave Agilent in Photonic Test & Measurement 2013 People enjoy the advantage of being online anytime and anywhere. Businesses and enterprises benefit from having real-time access to relevant data worldwide. Not being connected to a high-speed internet via wireless or wire-line has become a disadvantage both in private life and in business and the threshold for “high-speed” keeps advancing. Especially a new era of data-center infrastructure, enabling cloud computing, and big data storage and...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 3

Agilent Technologies Lightwave Catalog 2013 Since more than 30 years, Agilent offers high-performance solutions to support you in building the high-speed communication network. Your experience and feedback helped us to continuously improve the product performance and quality, while significantly reducing the cost, especially when it comes to manufacturing of optical components. Your needs and my confidence into our quality let me now offer our products with a 3-year warranty that's standard on all instruments, worldwide. This combination of reliability and coverage brings you three key...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 4

Applications: Swept-Wavelength Optical Measurement Solutions www.agilent.com/find/oct Swept-wavelength measurement solutions When insertion loss is low at some wavelengths and very high at others (high dynamic), like in DWDM components, it is very important that the broadband spontaneous emission from the TLS is very low. This avoids light transmitted in the passband of the component when the TLS wavelength is outside this band. The 81600B TLS provides light with very low source spontaneous emission (SSE), especially for components with more than 40-50 dB dynamic. The dynamic range of the...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 5

Applications: Optical Transient Measurements www.agilent.com/find/mppm Logging functionality basics Making transient optical power measurements with the N77-Series multiport optical power meter The measurement of time-dependent signals is realized with the easy-touse logging function of the optical power meters. The logging function is set up by choosing the number of logging samples, N, and the averaging time of each sample, t. The logging measurement is then started with a programming command or an electrical trigger. The instrument can be configured to make the complete logging...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 6

Applications: Wavelength and polarization dependent characterization of optical-toelectrical components www.agilent.com/find/n7700 The maximum and minimum responsivity vs. SOP are also determined, which is especially useful for polarizing components like ICR for polarization. multiplexed signals. The polarization dependence is also displayed as PDL and the TE/TM traces are also calculated, as for opticaloptical measurements. For balanced-detection components, the common-mode rejection ratio (CMRR) of detector pairs is also determined. The N7700A-100 software also has added functionality for...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 7

Applications: All-states method for PDL and PER www.agilent.com/find/pol All-states method for PDL and PER The all-states PDL method for measuring polarization dependent loss by scanning the polarization of light input to the DUT over a large sampling of all possible states is a good way to measure components with little wavelength dependence, so that the wavelength can be fixed during the scanning. Fiberoptic couplers, splitters and isolators are typical components to test this way. Tests of polarization beam splitters and other devices designed for high PER also benefit from this method,...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 8

Agilent 8163B, 8164B and 77-Series of Optical Instruments www.agilent.com/find/oct Modular and multi-channel platform for optical components and optical networks The Agilent 8164B - The platform for testing optical components Flexible Free combination of instruments for the best fit to each application Scalable The right form factor for each setup in R&D and manufacturing for singleport and multiport applications Efficient The Agilent 8164B lightwave measurement system supports a wide range of tunable laser modules together with capacity for up to 8 power meters in one box, for high...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 9

Agilent 8163B, 8164B and 77-Series of Optical Instruments www.agilent.com/find/n7700 The N7700A Photonic application suite • Display and overlay of traces from multiple channels and multiple measurement files • Scale switching between wavelength and frequency • Display of tabular analysis • Smoothing, markers and zooming • File loading, saving and data export • Direct launching of Excel and Matlab with data Insertion loss The Insertion Loss measurement package performs very accurate sweptwavelength insertion loss measurements using one of Agilent’s tunable laser sources along with optical...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 10

Agilent 81600B Tunable Laser Modules www.agilent.com/find/tls • Complete wavelength coverage from 1260 to 1640 nm Advantage of using suppressed laser noise (low SSE) Source Spontaneous Emission (SSE), the sum of all spontaneous emissions inside the laser diode of the tunable laser, is broadband light output in addition to the monochromatic laser line. This emission limits the noise floor of the tunable laser, which, in turn, limits the dynamic range of your measurements. The Agilent tunable laser source offers a high signal to source spontaneous emission ratio. For you, this means more...

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Lightwave Catalog: General Photonic Test 2013 Volume 1 - 11

Agilent 81600B Tunable Laser Modules (cont.) www.agilent.com/find/tls Output power, peak (typ) Output 1: ≥ 63/63/65/64 dB/nm Output 2: ≥ 42/42/45/45 dB/nm Output 1: ≥ 70 dB/nm Output 2: ≥ 48 dB/nm Signal to total SSE ratio Wavelength stability (typ) Power repeatability Wavelength repeatability Common to all 81600B options Stepped mode Continuous sweep mode (typ.) at 40 nm/s ±4.6 pm Wavelength repeatability Dynamic power reproducibility Dynnamic relative power flatness Wavelength resolution Maximum sweep speed Linewidth (coherence control off) Power stability Power linearity Output 1: ±0.1...

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