E7515A UXM Wireless Test Set
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Catalog excerpts

E7515A UXM Wireless Test Set - 1

Make a clear call The team looks to you: will a new chipset or UE pass the crucial tests? Clarity comes from accumulated insights, and that’s the idea behind the Agilent UXM wireless test set. The UXM is the most highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond. It provides the capabilities you need to test the newest designs, delivering LTE-Advanced category 6 now and handling increasingly complex test cases in the future. When the team counts on you, count on the UXM to help you make a clear call. Gain new insights with a broad range of integrated capabilities for LTE-Advanced design validation • Ensure LTE and LTE-A devices can sustain maximum cat 4/6 rates and handle realistic fading and MIMO scenarios • Thoroughly test every design with inte grated fading, flexible receiver testing and trusted transmitter measurements • Go deeper in functional testing by emula ting a wide range of complex operations Be ready for functional and RF design validation in 4G and beyond • Count on a future-ready, multi-format capable platform that will handle the next advancements in antenna techniques, component carriers and data rates • Evolve as technology changes, with an extensible architecture that includes high-speed interconnects, upgradeable processors and expansion slots • Easily handle tomorrow’s demanding test needs with versatile touch screen interface • Achieve greater confidence in RF perfor mance with industry proven Agilent X-Series measurement science and flexible Make a seamless transition to the UXM automated test capabilities • Get up and running quickly with a new yet-familiar user interface • Leverage current test libraries and tet cases with backwards-compatible SCPI

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E7515A UXM Wireless Test Set - 2

Assess design readiness with greater confidence Integrated capabilities for LTE-A design validation The UXM enables realistic verification of bidirectional category-6 performance with stable throughput at 300-Mbps downlink/50-Mbps uplink with integrated independent fading for each component carrier and 4x2 downlink MIMO. • Wring out designs with flexible receiver testing and trusted transmitter measure- ments • Reduce benchtop complexity with easy-to-use integrated fading and an internal application server Check RF performance and troubleshoot problems with trusted X-Series measurement...

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