
Catalog excerpts

Agilent Model Quality Assurance (MQA) Industry Standard SPICE Model Signoff and Acceptance Software Model Quality Assurance (MQA) is a collection of comprehensive SPICE model validation procedures, interfaces and utilities that provide the ability to thoroughly check SPICE model quality and automate QA and reporting procedures for various semiconductor devices. Given today’s advanced technologies and increasing model complexities, validating SPICE models is a significant challenge and can be very time consuming. The matrix of environment compliance across various foundries, technologies, process nodes and simulators, is becoming increasingly complex for many design houses and IDMs to manage. To assure model compliance, a comprehensive, robust, and customizable QA check is required. MQA satisfies this critical industry requirement with the unified, rules-driven, automated QA platform which efficiently integrates standard model libraries into design and flow environment compliance and documents results.
Open the catalog to page 1
Key Features • Default checking routines available for the latest BSIM-CMG, BSIM-IMG and BSIM6 model • Rules and checking functions are flexible and fully customizable • Supports Perl and TCL as Scripted-rule • Powerful plotting functions and utilities • Automated measurement QA feature enables to check the quality of mass measurement data • Powerful report generation • Easy sharing of model information • Powerful report generation and customization with Order and Template function • Large signal verification • Quick check syntax and link in library • Support of Load Sharing Facility (LSF)...
Open the catalog to page 2
MQA MQA is a unique software product developed to solve the following problems: SPICE model validation is becoming increasingly important and significantly more difficult. This is because: Model validation encompasses much more than just overlaying the measurement results to simulation results of the model • As the channel scales down, second-order physical effects make device modeling more complex. • The quality can only be guaranteed after fixed QA procedures are in place. • After all, measurement is limited to the number of physical devices in the test structure and the resolution of...
Open the catalog to page 3
• Quick display of measured device geometry and bias condition • Plot measured device characteristics • Check the trend of ldsat*L, Idsat/W and Customizable Checking Rules • Customize checking criteria and define sweeping range • Add your own rules and check new Powerful Plotting • Check scale, zoom in/out and digitalize the plots and apply math functions • All plots can be saved to a graphic file • The curves can also be displayed in a • Plot Smith Chart, polar chart and noise • Easily view the previously generated
Open the catalog to page 4
Equation Viewer Subckt Parameter Viewer This feature outputs model equations and automatically calculates the parameter values, OP values and intermediate vari- able values in the equations. This helps users to easily debug model issues and saves effort compared to calculating these values using other means (such as Excel). Check and verify the model parameters versus the instances of the subckt models Lib Explorer is an efficient way to clearly present and setup model libraries; all along, making QAwork easy and straight- forward. Within Lib Explorer, libraries are presented in a tree...
Open the catalog to page 5
Integrated Data Flow MQA natively supports IC-CAP WaferPro and WaferPro Express mdm data format and MySQL/ SQLite database. It realizes the seamless data transfer across Agilent’s device modeling platform from measurement, model extraction and model verification. Speedup by parallelism support on multiple levels MQA supports LSF and multiple level parallelism including simulator level, rule level and project level. It maximizes the model QA speed by allowing the user to efficiently utilize the hardware and license resources. MQA’s value proposition Quality Guarantee • Complete QA flow on...
Open the catalog to page 6
Supported Model Formats and Platforms • Global model, binning model, and macro (sub-circuit) model III-V FETs, HEMTs and HBTs MOSFETs (BSIM3v3, BSIM4, BSIM6, BSIMSOI, PSP, HiSIM2, HiSIM_HV), MGFETs (BSIM-CMG and BSIMIMG), diodes, BJTs (Gummel-Poon, VBIC, HiCUM, MEXTRAM), and passive devices (resistors, capacitors and inductors) Support platforms: Windows and Linux Supported simulators includes ADS, GoldenGate, HSPICE, Spectre, Eldo, FineSim, SmartSpice, AFS, SPICE3, etc. Product Structure Model Quality Assurance (MQA) provides the complete solution and framework to fabless design companies,...
Open the catalog to page 7
For more information on Agilent Technologies’ products, applications or services, please contact your local Agilent office. The complete list is available at: www.agilent.com/find/contactus Americas Canada Brazil Mexico United States Asia Pacic myAgilent myAgilent www.agilent.com/find/myagilent A personalized view into the information most relevant to you. Australia China Hong Kong India Japan Korea Malaysia Singapore Taiwan Other AP Countries Europe & Middle East Belgium Denmark Finland France Germany Ireland Israel Italy Netherlands Spain Sweden United Kingdom For other unlisted...
Open the catalog to page 8All KEYSIGHT TECHNOLOGIES catalogs and technical brochures
-
Network Visibility Products
24 Pages
-
RF Products
20 Pages
-
Basic Instruments
34 Pages
-
InfiniiVision 2000 X-Series
31 Pages
-
Signal Analyzers X-Series
21 Pages
-
KeysightCare
8 Pages
-
FieldFox and Nemo Handy
4 Pages
-
Impedance and Network Analysis
42 Pages
-
E4990A Impedance Analyzer
12 Pages
-
Keysight N6780 Series
10 Pages
-
E5071C ENA Network Analyzers
18 Pages
-
Keysight Process Analysis
7 Pages
-
BenchVue Software
2 Pages
-
Keysight Process Analysis
7 Pages
-
PXI RF Switch Modules
2 Pages
-
I/O Hardware
18 Pages
-
Digital Multimeters
28 Pages
-
Data Acquisition - DAQ
32 Pages
-
PCIe Digitizers
8 Pages
-
2015 Optical Component Test
40 Pages
-
Power Products Catalog
215 Pages
-
N9000A CXA Signal Analyzer
2 Pages
-
Agilent 89600 VSA Software
8 Pages
-
X-Series
23 Pages
-
CXA X-Series
8 Pages
-
SOLUTION BROCHURE
6 Pages
-
Waveguide Power Sensors
2 Pages
-
Power Meters and Power Sensors
34 Pages
-
E7515A UXM Wireless Test Set
2 Pages
-
E5063A Network Analyzer
8 Pages
-
N9320B RF Spectrum Analyzer
12 Pages
-
E5052B Signal Source Analyzer
21 Pages
-
N9038A MXE EMI Receiver
22 Pages
-
RDX Test Solutions for DigRF
17 Pages
-
M9252A DigRF Host Adapter
2 Pages
-
M9502A and M9505A
12 Pages
-
Oscilloscopes
16 Pages
-
Agilent Power Products
31 Pages
-
LIGHTWAVE CATALOG VOLUME I 2013
40 Pages
-
U4301A PCIe Analyzer
7 Pages
-
N9030A PXA Signal Analyzer
32 Pages
Archived catalogs
-
Agilent Technologies - Catalog
40 Pages