Series 3700A System Switch/Multimeter and Plug-In Cards Datasheet Key Features • Six-slot system switch mainframe with optional high performance multimeter • Multi-processor architecture optimized for high throughput scanning and pattern switching applications • Remote PC control via Ethernet, USB, and GPIB interfaces • Up to 576 two-wire or 720 one-wire multiplexer channels in one mainframe • Up to 2,688 one-pole matrix crosspoints in one mainframe The Series 3700A offers scalable, instrument grade switching and multi-channel measurement solutions that are optimized for automated testing of electronic products and components. The Series 3700A includes four versions of the 3706A system switch mainframe along with a growing family of plug-in switch and control cards. When the 3706A mainframe is ordered with the high performance multimeter, you receive a tightly integrated switch and measurement system that can meet the demanding application requirements in a functional test system or provide the flexibility needed in stand-alone data acquisition and measurement applications. • Embedded Test Script Processor (TSP®) offering unparalleled system automation, throughput, and flexibility • TSP-Link Technology master/slave connection provides easy system expansion and seamless connection to Series 2600 and 2600B SourceMeter® SMU instruments • Capable of over 14,000 readings per second to memory with optional high performance multimeter • LXI interface with embedded Web browser interface for test setup, maintenance, and basic application control Maximizes System Control and Flexibility To provide users with greater versatility when designing test systems, the Series 3700A mainframes are equipped with many standard features. For example, easy connectivity is supported with three remote interfaces: LXI/Ethernet, General Purpose Interface Bus (GPIB), and Universal Serial Bus (USB). Fourteen digital I/O lines are also included, which are programmable and can be used to control external devices such as component handlers or other instruments. Additionally, system control can be greatly enhanced by using our Test Script Processor (TSP) technology. This technology provides “smart” instruments with the ability to perform distributed processing and control at the instrument level

High Quality Switching at a Value Price This flexible resolution supplies a DC reading rate from >14,000 readings/second at 3½ digits to 60 readings/ second at 7½ digits to accommodate a greater span of applications. The multimeter does not use a card slot, so you maintain all six slots in your mainframe. In addition, the multimeter is wired to the mainframe’s analog backplane, ensuring a high quality signal path from each card channel to the multimeter. The Series 3700A builds upon Keithley’s tradition of producing innovative, high quality, precise signal switching. This series offers a growing...

Series 3700A System Switch/Multimeter and Plug-In Cards TSP Distributed Control Increases Test Speed and Lowers Test Cost TSP technology enhances instrument control by allowing users the choice of using standard PC control or of creating embedded test scripts that are executed on microprocessors within the instrument. By using TSP test scripts instead of a PC for instrument control, you avoid communication delays between the PC controller and instrument, which results in improved test throughput. Test scripts can contain math and decision- aking rules m that further reduce the interaction between...

Embedded Web Server The built-in Web interface offers a quick and easy method to control and analyze measurement results. Interactive schematics of each card in the mainframe support pointand-click control for opening and closing switches. A scan list builder is provided to guide users through the requirements of a scan list (such as trigger and looping definitions) for more advanced applications. When the mainframe is ordered with the multimeter, additional Web pages are included for measurement configuration and viewing, including a graphing toolkit. Built-in Web Server Interface 3. Analyze...

Series 3700A System Switch/Multimeter and Plug-In Cards High Performance Multimeter Specifications (Rev. A) DC Specifications 1 PLC or 5 PLC. For <1PLC, add appropriate “ppm of range” adder from “RMS Noise” table. Includes rear panel Analog Backplane connector and transducer conversion. Refer to DC Notes for additional card uncertainties. Test Current or Burden Voltage Input Resistance or Open Circuit Voltage 2 Accuracy ±(ppm of reading + ppm of range) (ppm = parts per million) (e.g., 10 ppm = 0.001%)

Temperature (Displayed in °C, °F, or K. Exclusive of probes errors.) Thermocouples (Accuracy based on ITS-90) 90 Day/1 Year, 23°C ± 5°C Using 3720, 3721, or 3724 Cards 90 Day/1 Year, 23°C ± 5°C Simulated reference junction 4-Wire RTD or 3-Wire RTD (100 Ω platinum [PT100], D100, F100, PT385, PT3916, or user 0 Ω to 10 kΩ) (Selectable Offset compensation On or Off) For 3-wire RTD, dmm.connect=dmm.CONNECT_FOUR_WIRE, ≤0.1 Ω lead resistance mismatching in Input HI and LO. Add 0.25°C/0.1 Ω of lead resistance mismatch.

Series 3700A System Switch/Multimeter and Plug-In Cards DC Speeds vs. RMS Noise Single Channel, 60 Hz (50 Hz) Operation. 1PLC and 5PLC RMS noise are included in DC specifications.

RTD Speeds vs. Noise 1 PLC and 5 PLC Noise are included in RTD Specifications. Add °C to Reading 16 Single Channel, 60Hz (50Hz) Operation Function Measurements into Buffer 13 (rdg/s) Measurement to PC 13 (ms/rdg) Azero Off System Performance 13, 14 3½-Digit Mode, Azero off, nPLC = 0.0005. Time includes function change from either DCV or 2WΩ to listed function. Function Buffer Transfer Speed Average for 1000 readings with timestamp Single Command Excecution Time (ms) Card channel.close (ch_list) or channel.open (ch_list) channel.close (ch_list) or channel.open (ch_list) channel.close (ch_list...