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Semiconductor Device Test

Semiconductor Device Test
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System SourceMeter® Instruments Semiconductor Device Test Applications Guide Contains Programming Examples

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this book, visit Keith ley's A GREATER MEASURE OF CONFIDENCE

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Table of Contents Section 1 General Information 1.1 Common-Emitter Characteristics . . . . . . . . . . 3.3.1 Test Configuration . . . . . . . . . . . . . . . 3.3.2 Measurement Considerations . . . . . . . . . 3.3.3 Example Program 4: Common-Emitter Characteristics . . . . . . . 3.3.4 Typical Program 4 Results . . . . . . . . . . . 3.3.5 Program 4 Description . . . . . . . . . . . . Gummel Plot . . . . . . . . . . . . . . . . . . . . . 3.4.1 Test Configuration . . . . . . . . . . . . . . . 3.4.2 Measurement Considerations . . . . . . . . . 3.4.3 Example Program 5: Gummel Plot . . . . . ....

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Common-Source Characteristics . . . . . . . . . . 4.3.1 Test Configuration . . . . . . . . . . . . . . . 4.3.2 Example Program 9: Common-Source Characteristics . . . . . . . . . . . . . . . . . 4.3.3 Typical Program 9 Results . . . . . . . . . . . 4.3.4 Program 9 Description . . . . . . . . . . . . 4.3.5 Modifying Program 9 . . . . . . . . . . . . . Transconductance Tests . . . . . . . . . . . . . . . 4.4.1 Test Configuration . . . . . . . . . . . . . . . 4.4.2 Example Program 10: Transconductance vs. Gate Voltage Test . . . . . . . . . . . . . . 4.4.3 Typical Program 10 Results . . . . . ....

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Program 11. Threshold . . . . . . . . . . . . . . . . A-52 Program 11A. Threshold (Search) . . . . . . . . . . . A-52 Program 11B. Threshold (Fast) . . . . . . . . . . . . A-56 Section 5. Using Substrate Bias . . . . . . . . . . . . . . Program 12. Substrate Current vs. Gate-Source Voltage (FET ISB vs. VGS) . . . . . . . . . . . . Program 13. Common-Source Characteristics with Substrate Bias . . . . . . . . . . . . . . Program 14. Common-Emitter Characteristics with Substrate Bias . . . . . . . . . . . . . . Section 6. High Power Tests . . . . . . . . . . . . . . . . A-78 Program 15. High...

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List of Illustrations Section 1 General Information Section 5 Using Substrate Bias Figure 1-1. Typical system configuration for applications . . 1-1 Figure 5-1. TSP-Link connections for two instruments . . . . Figure 5-2. TSP-Link instrument connections . . . . . . . . Figure 5-3. Program 12 test configuration . . . . . . . . . . Figure 5-4. Program 12 typical results: ISB vs. VGS . . . . . . Figure 5-5. Program 13 test configuration . . . . . . . . . . Figure 5-6. Program 13 typical results: Common-source characteristics with substrate bias . . . . . . . . . . . . Figure 5-7. Program 14...

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Section 1 General Information 1.1 Introduction The following paragraphs discuss the overall hardware and software configurations of the system necessary to run the example application programs in this guide. 1.2 Hardware Configuration 1.2.1 System Configuration Figure 1-1 shows the overall hardware configuration of a typical test system. The various components in the system perform a number of functions: Series 2600 System SourceMeter Instruments: System Source Meter instruments are specialized test instruments capable of sourcing current and simultaneously measuring voltage, or sourcing...

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Section 1 General Information on the digital I/O port on the Models 2601 and 2602 System SourceMeter instruments is not suitable for control of safety circuits and should not be used to control a safety interlock. The Interlock pin on the digital I/O port for the Models 2611, 2612, 2635, and 2636 can be used to control a safety interlock. Computer: The test programs in this document require a PC with IEEE-488 (GPIB) communications and cabling. Software: Series 2600 System SourceMeter instruments each use a powerful on-board test sequencer known as the Test Script Processor (TSP™). The TSP...

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Specifications are subject to change without notice. All Keithley trademarks and trade names are the property of Keithley Instruments, Inc. All other trademarks and trade names are the property of their respective companies. Keithley Instruments, Inc. ■ 28775 Aurora Road ■ Cleveland, Ohio 44139-1891 ■ 440-248-0400 ■ Fax: 440-248-6168 ■ 1-888-KEITHLEY ■ www.keithley.com Belgium Sint-Pieters-Leeuw Ph: 02-3630040 Fax: 02-3630064 info@keithley.nl www.keithley.nl china Beijing Ph: 8610-82255010 Fax: 8610-82255018 china@keithley.com www.keithley.com.cn finland Espoo Ph: 09-88171661 Fax:...

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