Power Device Testing Solutions for Design Validation, Characterization, and Reliability

Product catalog summary

Overview: The document discusses the challenges and solutions in testing modern power semiconductor devices, particularly those using advanced materials like Silicon Carbide (SiC) and Gallium Nitride (GaN). Key challenges include higher voltages, faster switching times, higher peak currents, and lower leakage times.

Tektronix/Keithley Solutions: The company offers a comprehensive range of DC and AC measurement solutions for design validation, characterization, and reliability testing of power semiconductor devices.

Oscilloscopes and Power Probes: These tools feature fast rise times, high sample rates, deep record lengths, and power analysis software. They support high-voltage and differential probing solutions.

Source Measure Unit (SMU) Instruments: These instruments provide high-speed, precision DC characterization and testing, with capabilities ranging from 100A to 0.1fA and 3kV to 100μV. TSP-Link® technology allows for multi-channel system configurations.

Arbitrary Function Generators: These devices offer function, arbitrary waveform, and pulse capabilities, supporting complete control loop characterization with up to 20V p-p performance. They allow for pulse generation with variable parameters and can be expanded by synchronizing multiple units.

Parametric Curve Tracer Configurations: Combining the features of a curve tracer and parametric analyzer, these configurations offer real-time graphing and parameter extraction with a wide dynamic range from μV to 3kV and fA to 100A. The system is flexible and reconfigurable to adapt to evolving power test requirements.

Conclusion: Tektronix/Keithley provides robust solutions for the testing of power semiconductor devices, addressing the challenges posed by advanced materials and high-performance requirements. For more information, visit their reference library.

Catalog excerpts

Power Device Testing Solutions for Design Validation, Characterization, and Reliability-1

Power Semiconductor Device Testing Solutions for Design Validation, Characterization, and Reliability Learn Tips and Techniques for Practical DC and AC Testing of Today’s Power Semiconductor Devices You face considerable challenges testing today’s power semiconductor devices, especially those that use advanced materials like Silicon Carbide (SiC) and Galium Nitride (GaN). Higher voltages and power levels Faster switching times Higher peak currents Lower leakage times The Tektronix/Keithley product portfolio spans DC and AC (time domain) measurements. We offer unique static and dynamic test and measurement solutions for design validation, characterization, and reliability testing of power semiconductor devices.

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Power Device Testing Solutions for Design Validation, Characterization, and Reliability-2

Explore our DC and AC Power Semiconductor Device Testing Solutions Visit our reference library at www.keithley.com/powerdevice to learn more. Source Measure Unit (SMU) Instruments n Single- or dual-channel, high speed, precision, DC characterization, and test instruments n From 100A to 0.1fA, 3kV to 100μV, up to 2000W pulsed power, single- or dual-channel n TSP-Link® technology links Series 2600 SMU instruments to form powerful multi-channel systems that rival the system speed of large ATEs Parametric Curve Tracer Configurations n Offers the best of a curve tracer and parametric analyzer management...

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