Catalog excerpts
table.main {} tr.row {} td.cell {} div.block {} div.paragraph {} .font0 { font:7.25pt "Lucida Sans Unicode", sans-serif; } .font1 { font:8.00pt "Lucida Sans Unicode", sans-serif; } .font2 { font:16.00pt "Lucida Sans Unicode", sans-serif; } .font3 { font:18.00pt "Lucida Sans Unicode", sans-serif; } .font4 { font:8.40pt "Tahoma", sans-serif; } .font5 { font:10.20pt "Tahoma", sans-serif; } .font6 { font:16.20pt "Tahoma", sans-serif; } .font7 { font:10.00pt "Times New Roman", serif; } WWW.KEITH LEY.CQM Keithley's SourceMeter Solutions Whether you're characterizing Light Emitting Diodes (LEDs) in an R&D lab, on the wafer level, in packaged devices or arrays, or as finished assemblies, you need instruments that deliver high accuracy sourcing and measurement. Today, for a growing number of LED manufacturers, that means Keithley's SourceMeter® instruments. Test types typically used in characterization of high brightness LEDs: ■ Forward voltage test (VF) ■ Reverse breakdown voltage (VR) ■ Leakage current (IL) Why Choose a Keithley SourceMeter Instrument for LED Testing? ■ Tight fonction intgration - All SourceMeter instruments provide simultaneous voltage and current sourcing and measurement capabilities in a single cost-effective enclosure. ■ Simpler system setup - SourceMeter instruments eliminate the synchronization and connection complexities associated with using separate sources and meters. ■ High-speed opration - Fast test speeds and tight triggering synchronization ensure higher throughput and a lower cost of test. ■ Wide dynamic range - The Keithley Series 2600A SourceMeter family offers industry-leading current range performance, from 10A in pulse mode down to 100nA, with 1pA resolution. ■ LED testing expertise - Keithley is the industry leader in developing and supporting solutions for electrical testing of LEDs and other opto devices. Typical LED DC I-V curve and test points (not to scale) Keithley's Solution for Testing Multiple LED Devices/Arrays Testing multiple devices or arrays over a specified period, such as during burn-in, requires sourcing a continuous current to drive the DUTs. Series 2600A System SourceMeter instruments are perfect for this application. Using embedded test script processing (TSP®) and TSP-Link® connectivity ensures tight instrument synchronization and control for maximum speed and simplicity For higher channel count applications, you can add a TSP-enabled Model 3706 System Switch/Multimeter. This model can handle up to 576 multiplexed channels or 2688 matrix cross-points and can be quickly and easily integrated through TSP-Link. PC PD LED 1 LED 2 LED 3 DIO LAN 2602A Channel A 2602A Channel B 2602A Channel A 2602A Channel B ft TSP-Link A GREATER MEASURE QF CONFIDENCE KEITHLEY
Open the catalog to page 1All Keithley Instruments catalogs and technical brochures
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6220-6221
5 Pages
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6482
3 Pages
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2520
8 Pages
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2606B
13 Pages
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2601B
20 Pages
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AFG1000 Series
13 Pages
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AFG31000 Series Datasheet
22 Pages
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2182A Nanovoltmeter
6 Pages
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6 Series B MSO
69 Pages
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Isolated Measurement Systems
8 Pages
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TBS1000B-EDU Series
14 Pages
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3 Series MDO
36 Pages
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4 Series MSO
40 Pages
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TSG4100A Series
24 Pages
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2461-EC Graphical Potentiostat
16 Pages
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2460-EC Graphical Potentiostats
15 Pages
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2450-EC Graphical Potentiostat
15 Pages
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4200A-SCS Parameter Analyzer
45 Pages
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MDO4000C Series Datasheet
43 Pages
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RTPA2A
6 Pages
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TPA-N-PRE Datasheet
4 Pages
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DPO4PWR·MDO3PWR Datasheet
6 Pages
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DPO4LMT/MDO3LMT Datasheet
6 Pages
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DPO7000 Series Datasheet
28 Pages
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SourceXpress® Datasheet
4 Pages
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10G-KR Datasheet
8 Pages
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DPO70000SX Series Datasheet
46 Pages
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AWG4000 Series Datasheet
20 Pages
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TLA6400 Series Datasheet
14 Pages
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Potentiostats 2450-EC
8 Pages
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4200-SCS
16 Pages
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2013 Keithley product catalog
403 Pages
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Nanotechnology Measurement
13 Pages
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Semiconductor Device Test
11 Pages
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Series 2400 SourceMeter®Family
16 Pages
Archived catalogs
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8 Series Sampling Oscilloscope
14 Pages
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Multimeter/Switch System
1 Pages