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Keithley Instruments
E-Guide: Re-Inventing High Power Semiconductor and Device Characterization

E-Guide: Re-Inventing High Power Semiconductor and Device Characterization

Product catalog summary

Introduction
The document discusses advancements in high power semiconductor device characterization, focusing on testing solutions from Keithley and Tektronix for high power, high voltage, and high current electronics.

Testing for Modern Devices
As demand for energy-efficient devices grows, testing equipment must accommodate higher voltages, power levels, and faster switching times. Materials like Silicon Carbide (SiC) and Gallium Nitride (GaN) challenge current testing capabilities.

Keithley DC High Power Solutions
Keithley offers configurable solutions such as the Model 8010 Test Fixture and SourceMeter® SMU Instruments, essential for testing modern semiconductor devices with high voltage and current capabilities.

Tektronix AC High Power Solutions
Tektronix provides mixed signal oscilloscopes and function generators for comprehensive power analysis, supporting high voltage and current probes for detailed switching loss analysis and timing characterization.

Parametric Curve Tracers
Keithley's Parametric Curve Tracer configurations offer flexible device testing, supporting both parametric and trace test modes, adaptable to changing test requirements.

High Voltage Electronics Testing
The Model 2657A High Power/High Voltage System SourceMeter® instrument is highlighted for its ability to source or sink high voltages and currents, suitable for R&D and production environments.

High Power, High Current Electronics Characterization
The Model 2651A High Power/High Current System SourceMeter® Instrument offers precision and flexibility, supporting digitizing and integrating measurement modes for accurate transient and steady-state behavior analysis.

Overview
The document details high power semiconductor device characterization using various instruments and software solutions, highlighting the capabilities of the Model 2651A SourceMeter, MSO/DPO Mixed Signal Oscilloscopes, and the AFG3000C Arbitrary/Function Generator.

Model 2651A SourceMeter
This instrument supports high precision waveform capture with 18-bit ADCs for transient characteristics and 22-bit ADCs for high accuracy measurements, capable of sourcing and sinking up to ±40V and ±50A.

Applications
The Model 2651A is used for power semiconductor, HBLED, and optical device testing, as well as characterization of GaN, SiC materials, and semiconductor junction temperatures.

Software Solutions
The ACS Basic and Standard Editions provide tools for semiconductor component testing, offering test libraries and analysis tools.

MSO/DPO Mixed Signal Oscilloscopes
These oscilloscopes offer bandwidths up to 2GHz and sample rates up to 10GS/s, featuring advanced triggers and power analysis modules.

AFG3000C Arbitrary/Function Generator
This generator supports arbitrary waveforms with up to 2 GS/s sampling rates and amplitudes up to 20 Vp-p.

Power Measurement and Analysis
The DPOPWR software transforms oscilloscopes into tools for switching component analysis, providing customizable reports and safe operating area testing.

Conclusion
The document emphasizes the integration of high power, precision, and flexibility in testing and characterizing semiconductor devices, offering a comprehensive suite of tools and instruments.

Specifications

Channel Expansion: Single and dual-channel models with optional expansion via TSP-link.
Current and Voltage Ranges: Models vary with maximum current from 50A pulse to 120mA and voltage from 40V to 3000V.
System Automation: Features digital I/O, TSP-link, and contact check capabilities.
Max Readings/Second: Up to 38,500 readings per second with an 18-bit digitizer.
Computer Interfaces: GPIB, LAN (LXI), RS-232, and USB connectivity.

Parametric Curve Tracer Configurations

Models range from entry-level to high current and voltage configurations.
Applications include incoming inspection, QA, reliability testing, and product development.
Software includes ACS Basic Edition with trace and parametric modes.

Oscilloscope Selector Guide

Channels: Options for 2 or 4 analog channels and 16 digital channels.
Bandwidth: Ranges from 100 MHz to 2 GHz.
Sample Rate: Up to 10 GS/s for analog and 16.5 GS/s for digital.
Connectivity: USB, LAN, and GPIB options available.
Waveform Math and Analysis: Includes automated measurements, FFT, and optional power analysis.

Contact Information
Provides global contact details for Keithley Instruments, including phone numbers and websites for various regions.

Catalog excerpts

E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-1

Re-Inventing High Power Semiconductor Device Characterization Application Advice & Product Selection

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-2

Reinventing High Power Semiconductor Device Characterization Green initiatives and energy efficiency standards worldwide have motivated engineers to find ways to design more efficient semiconductor devices and integrated circuits. High power semiconductor end applications are becoming increasingly demanding, requiring test instrumentation capable of characterizing significantly higher voltages, higher power levels, faster switching times, higher peak currents, and lower leakage currents than ever before. Tektronix and Keithley offer a broad spectrum of tools, both hardware and software, for power...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-3

Testing for Today’s and Tomorrow’s Power Semiconductor Devices Due to more demanding end applications and the use of advanced materials such as Silicon Carbide (SiC) and Galium Nitride (GaN) in today’s power devices, test instrumentation must be capable of characterizing significantly higher voltages, higher power levels, faster switching times, higher peak currents, and lower leakage currents than ever before. Even more significant, breakdown and leakage test are typically performed at 2–3 times the level of the rated or operating voltage. When the devices are in the ON state, they have to pass...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-4

Keithley’s Configurable DC High Power Solutions Model 2636B SourceMeter® SMU Instrument n Two independent SMU channels n Up to 200V, up to 10A pulsed n 0.1fA measurement resolution Model 2657A High Power Source Measurement Unit (SMU) Instrument n Up to 3000V, Up to 180W of power n 1fA measurement resolution n Digitizing and integrating ADCs Model 2651A High Power System SourceMeter Instrument n Up to 50A pulsed (up to 100A with 2 units) n Up to 2000W pulse / 200W DC power n Pulse widths from 100µs to DC n Digitizing and integrating ADCs Model 8010 Test Fixture: Provides safe environment for testing...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-5

Tektronix AC High Power Solutions Mixed Signal Oscilloscopes Key Features n High sample rates to capture transitions n Deep record lengths for long acquisition n Power analysis application software available n Supports full range of high voltage, high current, and differential probes Typical Tests n Comprehensive switching loss analysis n Turn-on/Turn-off timing & characterization n Recovery time n Dynamic On Resistance Probes Our probes and accessories are perfectly matched to our industryleading oscilloscopes. With over 100 choices available, you’re certain to find the probe that best fits...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-6

High Power Device Characterization with Parametric Curve Tracers Characterizing and testing today’s high power semiconductor devices and components is placing a high demand on test equipment. Device design engineers need equipment that can support them throughout the complete lifecycle of a power device. Today, high power characterization systems are available in two main forms — complete turnkey systems and building blocks that must be configured by the user and completed with good software. Turnkey systems can be set up and running quickly, but they can be quite expensive and limited in the...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-7

Characterize and Test High Voltage Electronics and Power Semiconductors The Model 2657A High Power/High Voltage System SourceMeter® instrument adds high voltage to Keithley’s SourceMeter SMU instruments family of high speed, precision source measurement units. Suitable for R&D, production, and QA/FA, it: n Sources or sinks up to 3000V @ 20mA or 1500V @ 120mA –able to capture important parametric data that other equipment can’t n Provides 1fA (femtoamp) current measurement resolution for measuring the lowleakage requirements of next-generation devices n Eliminates the hassle of integrating power...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-8

Ready to learn more? Download the Model 2657A datasheet. SourteMtier' Instrument Read the Application Notes: - Creating Multi-SMU Systems for High Power Semiconductor Characterization. The recent push for higher power, more efficient semiconductor devices has spurred the development of devices based on advanced materials that surpass the limitations of devices built on silicon. DC characterization of power semiconductor devices requires test systems that incorporate high voltage and high current source measurement units (SMUs). The steps required to properly build these test systems are detailed...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-9

Get Unmatched Performance for Characterizing and Testing High Power, High Current Electronics Our new Model 2651A High Power/High Current System SourceMeter® Instrument simplifies characterizing today’s challenging high power electronics with unprecedented power, precision, speed, flexibility, and ease of use. It combines a highly flexible, fourquadrant voltage and current source/load with precision voltage and current meters. n Source or sink 2,000W of pulsed power (±40V, ±50A), 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A) n Easily connect two units (in series or parallel) to create solutions...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-10

Ready to learn more? Download the Model 2651A datasheet. Hg|i Power System SairoeMdCT Instrument - l.MCW of RilMd ptwr ■ Ewhr CVrmKt lim wn^j (in writ-i. t'rpjHiBHJ 10 (r*iba ■upptr, c«imnt HIUKI. DMM, aibiErjrr "riiiFF-ar™ jjnrrj'nr. irif T |*nlnUiii m jtflKilrrr- JII-I M Ihr UN iHuNlfi jriJ rvidulria «B«M iip.k»lm IhlWJWtXIbntfticnalHUSaWLcllctti auiam I«IX> . haj* .ViMr. kW Read these Application Briefs: - Achieving Fast Pulse Measurements for Today's High Power Devices. Learn how to achieve the fast, pulsed measurements needed for today's high power devices. ' thilrtimir.nr.kin hludi*-, tMUMnm...

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E-Guide: Re-Inventing High Power Semiconductor and Device Characterization-11

Multi test mode allows multiple tests to be performed on a device. Software for High Power Device Characterization Keithley’s Automated Characterization Suite (ACS) Software combines with the high power, precision, speed, and flexibility of Keithley’s Series 2600 High Power System SourceMeter® SMU instruments and Parametric Curve Tracer configurations to create a complete environment for high power semiconductor component characterization. Depending on your application, choose from ACS Basic Edition for single device testing or ACS Standard Edition for wafer-level, multi-DUT test automation or...

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