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DPO4LMT/MDO3LMT Datasheet

DPO4LMT/MDO3LMT Datasheet
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Limit and Mask Test Application Module DPO4LMT/MDO3LMT Datasheet Limit test A common method for understanding your signal quality is to test against a known good or “golden” waveform. You can apply horizontal and vertical tolerances to the golden waveform to create a mask that can be used for quick, accurate Pass/Fail testing. This method is also a great way to perform go/no-go testing on a manufacturing line by enabling repeatable, fast decisions on the quality of a component or system. The Limit and Mask Test Application Module allows you to save your limit test mask for use later across multiple oscilloscopes in a lab or on a production line. Key features Conduct limit test Pass/Fail testing against a “golden” waveform with tolerances Perform mask testing on ITU-T, ANSI T1.102, and USB standards Perform mask testing on custom user-defined masks Detailed test statistics provide insight into true signal behavior Customizable tests allow for multiple actions upon violations or test failures High waveform capture rates enable thousands of waveforms to be tested per second Limit Test finds infrequent glitches and runt signals using a mask created by adding vertical and horizontal tolerances around a golden waveform. Quickly test your signals against a golden waveform and quickly gain insight into anomalous behavior. Automated pass/fail testing Standard mask test Validating signal quality is an important part of any embedded system design. One way to determine how well your signals conform to expected signal quality is to use mask testing. A mask defines a portion, or portions, of the oscilloscope display that a signal must not enter. Whether you need to test to a well-defined telecommunication or computer standard or are interested in validating how your signals are performing compared to a known good condition, the Limit and Mask Test Application Modules for the MDO4000 and MDO3000 Series provide instant automated statistical analysis of signal quality. The Limit and Mask Test capability makes testing against telecommunication and computer industry standards easy by making mask definition quick and accurate, allowing flexible testing configurations, and providing detailed statistical test results. More than 40 standard telecommunications and computer industry standard masks are included with the DPO4LMT application module. Each standard mask is easily loaded from the oscilloscope internal memory and can be immediately used to conduct Pass/Fail testing. Adherence to a standard is determined pixel-by-pixel throughout the display. Masks for ITU-T up to 155 Mb/s data rates, ANSI T1.102 up to 155 Mb/s data rates, and high-speed USB 2.0 are included.

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USB 2.0 high-speed standard mask showing results from a mask test. In the DPO4LMT application, a robust set of telecommunications and computer industry standard masks make testing to standards quick and accurate. Flexible test configuration The Limit and Mask Test Application Module provides flexible test definitions, enabling you to tailor the test to your needs. You can run a test for a user-defined number of waveforms (up to 1,000,000) or for a userdefined amount of time (up to 48 hours), or set either criteria to infinity and run the test until you manually stop it. The Repeat Test and...

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Limit and Mask Test Application Module — DP04LMT/MD03LMT All specifications apply to all models unless noted otherwise. Limit test specific Mask creation margins Vertical tolerance from 0 to 1 division in 1 m (1/1000th) division increments Horizontal tolerance from 0 to 500 m division in 1 m (1/1000th) division increments Mask test specific

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Datasheet Mask test specific Included standard masks (DPO4LMT only) ITU-T Mask creation Load custom mask from text file with up to eight segments DPO4LMT only: Select standard mask from internal memory DPO4LMT only: Copy a standard mask to custom mask Custom mask vertical margin From –50% to +50% A positive value spreads upper and lower segments apart, a negative value brings upper and lower segments closer together.

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DPO limit and mask tests Limit and Mask Test Application Module — Hits within a mask are highlighted for easy viewing Mask scaling Lock to Source ON: Mask automatically rescales with source-channel settings changes Lock to Source OFF: Mask does not rescale with source-channel settings changes Test criteria run until Minimum number of waveforms (from 1 to 1,000,000; Infinity) Minimum elapsed time (from 1 second to 48 hours; Infinity) Pretest delay From 0 to 200 s Repeat on completion ON: Test will repeat when the minimum number of waveforms or minimum amount of time is reached OFF: Test will...

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The Limit and Mask Testing Application Module for the MDO4000 Series (DPO4LMT) or for the MDO3000 Series (MDO3LMT) enables testing against limit masks generated from "golden" waveforms and mask testing using custom user-defined masks. The DPO4LMT module also enables mask testing using standard telecommunication and computer industry masks. ≥350 MHz bandwidth models are recommended for mask testing on telecomm standards >55 Mb/s. 1 GHz bandwidth models are recommended for mask testing on high-speed (HS) USB. Recommended probes Please refer to www.tek.com/probes for further information on the...

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