4200A-SCS Parameter AnalyzerDATASHEET See your innovations come to life. The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization. The highest performance parameter analyzer, the 4200A-SCS accelerates semiconductor, materials, and process development. The 4200A-SCS Clarius™ GUI-based Software provides clear, uncompromised measurement and analysis capability. Furnished with embedded measurement expertise and hundreds of ready-to-use application tests, Clarius Software enables you to dig deeper into your research with speed and confidence. The 4200A-SCS Parameter Analyzer is completely customizable and fully upgradable, so you can add the instruments you need now - or later. With the 4200A-SCS Parameter Analyzer, making connections to your bold discoveries has never been easier. I-V Source Measure Units (SMUs) • 10 aA measure resolution with optional preamp • 10 mHz - 10 Hz very low frequency capacitance measurements C-V Multi-frequency Capacitance Units (CVUs) • ±30 V (60 V differential) built-in DC bias, expandable to ±210 V (420 V differential) • Simple switching between I-V and C-V measurements with the optional CVIV Multi-Switch Pulsed I-V Ultra-fast Pulse Measure Unit (PMU) • Two independent or synchronized channels of high-speed pulsed I-V source and measure • Transient waveform capture mode • Arbitrary waveform generator for multi-level pulse waveform with 10 ns programmable resolution High Voltage Pulse Generator Unit (PGU) • Two channels of high-speed pulsed V source • Arbitrary waveform generator Segment ARB® mode for multi-level pulse waveform with 10 ns programmable resolution I-V/C-V Multi-Switch Module (CVIV) • Easily switch between I-V and C-V measurements without re-cabling or lifting prober needles • Move the C-V measurement to any terminal without re-cabling or lifting prober needles Remote Preamplifier/Switch Module (RPM) • Automatically switches between I-V, C-V, and ultra-fast pulsed I-V measurements • Extends current sensitivity of the 4225-PMU to tens of picoamps • Reduces cable capacitance effects

PARAMETER ANALYZER Project Tree lets you organize tests and control test * sequencing without writing code More than 450 application tests » jumpstart your testing (1920x1080) HD display enables easier interactive testing Standard ports include: USB, Ethernet, VGA, serial, DisplayPort, Built-in HDMI, audio jacks ground unit Select Configure Projects My Settings Learning Center Terminal Settings Help n-MOSFET Drain Family 2022/05/17-08:55:23: Total Execution Time: 00:00:00:09 Accepts up to nine medium or high power SMUs and optional remote preamplifiers Tag and organize test results USB 3.0 and...

Take your research to new levels of understanding with the new Clarius Software user interface. The 4200A-SCS includes the Clarius+ software package, which allows performing nearly any type of I-V, C-V, and pulsed I-V characterization test. The Clarius Software user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. • Ready-to-use, modifiable application tests, projects and devices that reduce test development time • Industry's first...

Step 1 - Build your Test Plan Search, filter, and select from more than 450 pre-defined application tests, projects, and devices from the Clarius library. Filter test, device, or project libraries for quick selection Learn about each test with more detailed information including: • Comprehensive test descriptions • Schematic view of test • Required equipment • Short videos and application notes

operation modes at a glance. Key Parameters View provides a visual perspective on each test and device and helps to reduce the learning curve. All Parameters View is ideal for entering test parameters. Step 3 - Analyze ResultsView results either graphically or numerically, filter your test data, and tag data for easy identification.vds-id-pulse-smu_ LatestRun MOSFET to induce self-healing using dc l-V and a test that uses the SMU pulsing capability to redut “— data for the tests in this project includes: ■ Three 4200-PAs (mounted on the rear pa 4200A-SCS) ■ Four 2 m preamplifier triaxial cables...

2. Source Measure Units (SMU) Field Installable SMUs Precision DC current vs. voltage (I-V) measurements are the cornerstone of device and materials characterization. World-class source measure unit (SMU) instruments are at the core of the 4200A-SCS Parameter Analyzer. A source measure unit can source either voltage or current and can simultaneously measure both voltage and current with high resolution and accuracy. The SMU integrates the voltage source, current source, ammeter and voltmeter in one instrument card for tight synchronization of I-V measurements. Need to replace or add SMUs to your...

Very-low Frequency C-V Technique with SMUs The 4200A-SCS offers the unique ability to perform very-low frequency capacitance-voltage measurements without an LCR meter or capacitance module. Low frequency C-V measurements are used to characterize the slow trapping and de-trapping phenomenon in some materials. Capacitance-voltage (C-V) measurements are often used to characterize a MOSFET’s gate oxide thickness, oxide defect density, doping profiles, etc. In this measurement, as the gate voltage varies, the capacitance of the gate to the drain and source changes. Capacitance measurements are typically...

The 4200-CVU-PWR option is available to support: • High power C-V measurements up to 400 V (200 V per device terminal) for testing high power devices, such as MEMS devices, LDMOS devices, and displays. • DC currents up to 300 mA for measuring capacitance when a transistor is turned on. Ensure Validity of your Results Unlike other C-V modules on the market, the 4210-CVU and 4215-CVU are designed with unique, patented circuitry to support features and diagnostic tools that ensure the validity of your results. • Move the DC bias to the terminal of choice. With just a click in the Clarius Software,...