2606B System SourceMeter® SMU InstrumentDatasheet The 2606B System SourceMeter Source Measure Unit (SMU) Instrument offers four 20-watt SMU channels in a 1U high form factor chassis. Built from Keithley's third generation SMU technology, the 2606B offers the combined capabilities of a precision power supply, true current source, 6^-digit DMM, arbitrary waveform generator, and pulse generator-all into one tightly-integrated instrument. The result is a powerful solution that significantly boosts productivity for demanding automated qualification and production testing for optoelectronic devices such as VCSELs/laser diodes used in 3D sensing, telecommunication, and LEDs used in consumer products and automobiles, as well as integrated devices like analog ICs, ASICs, and system-on-a-chip (SOC) devices. When a high SMU channel count is required, multiple 2606B units can be stacked on top of each other without the need for thermal spacing between units. Built-in web browser-based software enables communicating to the 2606B through any computer from anywhere in the world. For automated system applications, the 2606B's Test Script Processor (TSP®) technology runs complete test programs from inside the instrument for industry-best throughput. In larger, multi-channel applications, Keithley's TSP-Link® technology works together with TSP technology to enable high-speed, SMU-per-pin parallel testing. Each 2606B SMU is code compatible with the industry leading Keithley 2602B System SourceMeter SMU Instrument when you are using the new ranges. Key Features • Four-channel SMU instrument in a single 1U full rack chassis • Stackable; no 1U spacing requirements between units • Tightly-integrated voltage/current source and measure instruments offer best in class performance with 6^-digit resolution • 20 V @ 1 A and 6 V @ 3 A power envelopes, 20 watts • 0.015% DCV basic accuracy • Up to 28 open drain digital I/O bits • Correlated results to the 2602B System SourceMeter SMU Instrument • TSP technology embeds complete test programs inside the instrument for best-in-class system-level throughput • TSP-Link expansion technology for multi-channel parallel test without a mainframe • Front Panel LAN (LXI-C), USB 2.0 TMC488 protocol, and digital I/O interfaces • Built-in web browser based software enables remote control through any browser, on any computer from anywhere in the world

Unmatched Throughput for Automated Test with TSP Technology For test applications that demand the highest levels of automation and throughput, the 2606B’s TSP technology delivers industry-best performance. TSP technology goes far beyond traditional test command sequencers – it fully embeds then executes complete test programs from within the SMU instrument itself. This virtually eliminates time-consuming bus communications to and from the PC controller and thus dramatically improves overall test times. All channels in the TSP-Link system are synchronized to under 500 ns. • Conditional branching...

2606B System SourceMeter ® SMU Instrument Typical Applications I-V functional test and characterization of a wide range of devices, including: • Optoelectronic devices – Vertical cavity surface emitting lasers (VCSELs), laser diodes (used on 3D sensing systems) – High brightness (HBLEDs), lightemitting diodes (LEDs) 2606B SMU instruments are easily racked and stacked in a rack system with minimum rail depth of 27 inches (0.686 m). Third-generation SMU Instrument Design Ensures Faster Test Times Based on the proven architecture of the Series 2600B instruments, the 2606B’s SMU instrument design...

Specification Conditions This document contains specifications and supplemental information for the 2606B System SourceMeter® instrument. Specifications are the standards against which the 2606B instruments are tested. Upon leaving the factory, the 2606B instruments meet these specifications. Supplemental and typical values are nonwarranted, apply at 23°C, and are provided solely as useful information. Specifications are for individual modules. Source and measurement accuracies are specified at the 2606B terminals under these conditions: 2. After a two-hour warm-up period 3. Speed normal (1 NPLC)...

2606B System SourceMeter ® SMU Instrument Current Accuracy Specifications 3 Source Range Programming Resolution Accuracy ±(% reading + amperes) Measure Typical Noise (peak to peak) 0.1 Hz to 10 Hz Display Resolution Accuracy 5 ± (% reading + amperes) Supplemental Characteristics The following specifications are supplemental characteristics that provide additional information about instrument functions and performance. These characteristics are nonwarranted specifications; they describe the typical performance of the 2606B. Additional Source Characteristics < 20 mV peak-peak, < 3 mV RMS, 6 V range...

Pulse Width Programming Accuracy ±5 |js Pulse Width Jitter 2 js Transient Response Time <70 js for the output to recover to within 0.1% for a 10% to 90% step change in load. Overshoot Voltage: <±0.1% of range + 10 mV. Step size = 10% to 90% of range, resistive load, maximum current limit/compliance Current: <±0.1% of range. Step size = 10% to 90% of range, resistive load. See Current Source Output Settling Time for additional test conditions. Range Change Overshoot Voltage: <300 mV + 0.1% of larger range. Overshoot into a 100 kO load, 20 MHz bandwidth. Current 7: <300 mV/RLOAD + 5% of larger...

2606B System SourceMeter® SMU Instrument Additional Measurement Characteristics Current Measure Settling Time 10 Time required to reach within 0.1% of final value after source level command is processed on a fixed range. Values below for Vout = 1 V Notes 10. Compliance equal to 100 mA. 11. Tests performed using the following equipment: Computer hardware — Intel® Core™ i7 at 2.90 GHz, 8 GB RAM; software — Microsoft® Windows® 10 Enterprise 64-bit, Microsoft® Visual Studio® 2010, VISA™ version 5.8. 12. Exclude current measurement ranges less than 1 mA.