Key Features • Complete solutions engineered for optimum price and performance • Field upgradable and reconfigurable - convert your PCT to a reliability or wafer sort tester • Configurable power levels: • Wide dynamic range: • Full range of capacitance-voltage (C-V) capability : Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley’s line of high power Parametric Curve Trace configurations supports the full spectrum of device types and test parameters. Keithley’s Parametric Curve Trace configurations include all necessary hardware for the characterization engineer to develop a complete test system quickly. Ordered separately, ACS Basic Edition software provides complete device characterization, including both real-time trace mode for quickly checking fundamental deivce parameters like breakdown voltage and full parametric mode for extracting precise device parameters. ACS Basic Edition goes beyond traditional curve tracer interfaces by offering a broad array of sample libraries. More important, users have complete control of all test resources, allowing the creation of more advanced tests than previously possible on a curve tracer. - Supports 2, 3, and 4 terminal devices • High performance test fixture supports a range of package types • Probe station interface supports most probe types including HV triax, SHV coax, standard triax, • Power semiconductor device characterization and testing • Characterization of GaN and SiC, LDMOS and other devices • Reliability studies on power devices • Incoming inspection and device qualification

Electrical characterization of a variety of power device types, including: Measurements of key parameters, such as: • Breakdown Voltage (Bvdss, Bvceo) • On-State Current (Vdson, Vcesat, Vf) • Drain/Collector Leakage (Idss, Ir/Icbo,Iceo) • Gate/Base Leakage (Igss, Ib) • Threshold or Cutoff voltage (Vth, Vf, Vbeon) • Forward Transfer (yfs, Gfs, Hfe, gain) • Capacitance (Ciss, Coss, Crss)

2600-PCT-xB Parametric Curve Tracer Configurations PROBE STATION 8010 High Power Device Test Fixture PACKAGED PARTS CHARACTERIZATION Keithley’s Parametric Curve Trace configurations support both package part and wafer level testing. Keithley's Parametric Curve Trace configurations are complete characterization tools that include the key elements necessary for power device characterization. The measurement channels consist of Keithley SourceMeter® Source Measure Unit (SMU) Instruments and an optional Multi-frequency capacitance-voltage (C-V) meter. The dynamic range and accuracy of these instruments...

1. Test method used for extracting the parameter. Only typical MOSFET listed, but similar method for other devices. 2. 2657A High Power System SourceMeter® SMU Instrument. 4. 2651A High Power System SourceMeter SMU Instrument or optional dual 2651A High Power System SourceMeter SMU Instruments. 6. Typical extracted capability (Example: 1 mA/1 V ~ 1 A/1 mV). 7. Typical extracted capability (Example: 1 mV/10 A). 8. Max. ±200 VDC (or ±3kV) bias with PCT-CVU and CVU-3K-KIT.

2600-PCT-xB Parametric Curve Tracer Configurations Semiconductor Parametric Test Software for Component and Discrete Devices ACS Basic Edition software is specifically tuned to take advantage of the high performance capabilities of the Keithley instrumentation and includes several sample libraries for performing common high power device tests. Unlike other systems, the software allows the user almost unlimited flexibility in configuring all of the measurement channels to create tests far beyond what a traditional curve tracer could achieve. Multi test mode allows multiple tests to be performed...

Compared to a traditional curve tracer, PCT graphics offer high resolution, on-screen data analysis, complete graph customization, and easy export to any word processor or reporting software. Summary of Typical Tests Device Bipolar Junction Transistor IEBO, IECO, IEVEB, ICVCB BVCBO, BVCEI, BVCEO, BVCEV, BVEBO, BVECO IBCO, IBEO, IBICVBE, IBVBE, ICBO, ICEV, ICVCE_BiasIB, ICVCE_BiasVB, ICVCE_StepIB, ICVCE_StepVB, VBCO, VCE BVDSS, BVDSV, BVGDO, BVGDS, BVGSO IDVD_BiasVG, IDVD_StepVG, IDVG_BiasVD, IDVG_StepVD, IDVG_StepVSUB, IGVG, VTCI, VTEXT, VTEXT_IISQ DYNAMICZ, IFDVFD, VFDIFD, VRDIRD Ciss, Coss,...

2600-PCT-xB Parametric Curve Tracer Configurations 2600-PCT-4B High Voltage and High Current All cables and adapters for connecting to the 8010 Test Fixture or 8020 High Power Interface Panel Note: PC and monitor not included; user must supply a Windows XP/7 PC with a USB port. 2651A High Power System SourceMeter (adds 50 A to any system, max 100 A) 2657A High Power System SourceMeter (adds 3 kV to any system, max of one unit per system) PCT-CVU Multi-frequency Capacitance-Voltage (C-V) Meter 8020 High Power Interface Panel: Ideal for connecting to probe stations 8010 High Power Device Test Fixture...

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