JEOL Products Guide Nanometrology Fabrication Characterization

Introduction Thank you for your interest in JEOL products and services. JEOL designs and manufactures scientific instruments for high-level research and development activities. Our customers include scientists and engineers working in leading-edge academic and industrial laboratories around the world. JEOL products and services enable them to pursue a variety of R&D applications that require high resolution imaging and analytical capabilities such as: basic observation and analysis, environmental science, information technology, semiconductor production, biotechnology, nanotechnology, and a broad...

Scientific/Metrology Instruments Industrial Equipment Medical Equipment ■ Transmission Electron Microscopes (TEM) ■ Scanning Electron Microscopes (SEM) ■ Ion Beam Application Equipment ■ Instruments for Microarea and Surface Analysis ■ X-ray Fluorescence Spectrometers ■ Industrial Equipment for thin-film formation and material processing ■ Clinical Chemistry Analyzers * Some instrument photographs include optional attachments. * Specifications subject to change without notice. * This catalog includes products not offered in some territories. * W indows is a registered trademark of Microsoft Corp....

Transmission Electron Microscope Atomic Resolution Analytical Electron Microscope The “GRAND ARM™” has been upgraded. The JEM-ARM300F2 GRAND ARM™2 is JEOL’s flagship EM that combines ultrahigh spatial resolution observation and high sensitivity X-ray analysis at a wide range of accelerating voltage from low acceleration to high acceleration. With the adoption of a new enclosure cover that can reduce the effect of environment changes as well as improved acoustic noise resistance of the column, the ultimate microscope stability has been realized. ● Resolution: 0.053 nm (300 kV, with STEM corrector)...

Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as proteins, for single particle analysis, tomography and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at customer sites to meet the needs of the facility. These improvements allow users to obtain high quality...

High Throughput Analytical Electron Microscope The JEM-ACE200F is an electron microscope responding to the system allowing for an operator to obtain data without operating the electron microscope by creating recipes for operation workflow. Since the JEM-ACE200F inherits hardware technologies of the JEM-ARM200F high-end TEM and the JEM-F200 multi-purpose FE-TEM, this high throughput analytical electron microscope provides superbly high stability and analytical capabilities with a renewed sophisticated exterior design. ● STEM resolution: 0 .10 nm (200 kV, STEM Cs corrector installed) resolution:...

Scanning Electron Microscopes Schottky Field Emission Scanning Electron Microscope The JSM-IT800 employs an easy-to-use graphical user interface, called “SEM Center”, which serves as a common platform enabling a full range of functionality from high resolution observation to high speed elemental mapping. This platform features a JEOL In-Lens Schottky Plus Field Emission Electron Gun, a next-generation electron optical control system, “Neo Engine”, and a fully embedded JEOL EDS system. The JSM-IT800 satisfies various needs of users by utilizing a hybrid design of SEM objective lens. Five versions...

Schottky Field Emission Scanning Electron Microscope - Clear visibility promotes new discovery The JSM-IT710HR is the latest model of HR series for anyone to easily acquire high resolution images. A new low-vacuum secondary electron detector and 3D live observation function have achieved further enhanced observation performance. This new SEM improves stability of the electron gun (4 times higher stability than the previous model) that delivers a maximum probe current of 300 nA. With expanded automatic measurement functions, automatic analysis at FE-SEM resolution is easier than ever to use. ●...

Benchtop Scanning Electron Microscope JCM-7000 is a new benchtop scanning electron microscope with helpful functions. Low vacuum (LV) mode makes it possible to observe without sample preparation. Stage Navigation System helps users easily look for the area of interest. Zeromag provides smooth transition from optical images to SEM images. Live Analysis enables real-time elemental analysis during observation. Furthermore, Live 3D gives 3D image restructure simultaneously with the SEM image. JCM-7000 has incorporated those new functions with the aim of enabling anyone to perform observations and...

Ion Beam Application Equipment New Product JIB-PS500i FIB-SEM System The JIB-PS500i combines the high image quality, high-resolution SEM and high-performance FIB enabling accurate and high-quality TEM specimen preparation at the intended area of the specimen. The large specimen stage with large tilt angles makes it easy to perform TEM specimen preparation such as trimming specimen blocks. Check and Go function enables a screening check of prepared specimens with a newly-developed STEM detector. The use of the double-tilt cartridge and TEM holder facilitates a linkage of FIB and TEM. ● SEM resolution:...

Peripheral Equipment This is a device for removing hydrocarbon contaminants deposited on the sample using physical and chemical reactions while maintaining the sample in a glow discharge. Collecting the hydrocarbon contaminants helps to prevent the generation of sample contamination when an electron beam is irradiated onto the sample by an electron microscope, and by accumulation of hydrocarbon contaminants (contamination). HD Treatment is a device that was designed with the electron microscope sample fabricator in mind, offering the long-desired hydrophilic treatment applicable to a wide range...