Scientific / Metrology Instruments Schottky Field Emission Scanning Electron Microscope GENTLEBEAM Super High Resolution (GBSH) ™ High resolution to extreme high resolution at low accelerating voltage

Providing a GBSH mode to SEM equipped with semi-in lens objective lens. Aiming at further low accelerating voltage and high resolution. GENTLEBEAM Super High Resol EAM A AM Resolution mode esolu s so TM TM Top model performance p performance GB mode Standard mode The GBSH mode applies a negative voltage to the specimen to decelerate the incoming primary electron beam just before landing the Electron probe specimen. Accordingly, the GBSH mode enables the high resolution observation at low accelerating voltages (the lowest is 10 V). Since the scattering of the electron beam within the specimen...

Application Application of GBSH mode p The high quality backscattered electron imaging at high accelerating voltage can be easily obtained as well as in the observation of secondary electron imaging at low accelerating voltage. The observation of nanoparticles at super low accelerating voltage 10 nm Specimen: CeO2 nanoparticles (Professor Seiichi Takami, Nagoya University, Japan) Accelerating voltage: 0.5 kV (GBSH mode) Signal: secondary electrons Detector: SEI  Magnification: ×500,000 10 nm Specimen: Au particles Accelerating voltage: 0.5 kV (GBSH mode) Signal: secondary electrons Detector: SEI Magnification:...

Cover photograph Specimen: mesoporous silica Accelerating voltage: 0.3 kV (GBSH mode) Signal: secondary electrons Detector: SEI Magnification: ×200,000 Mesoporous silica is silicon dioxide with uniform and ordered pores (mesopores). It has been expected to be applied as the support of catalysts and adsorbent materials. The wall of mesopores, which thickness is less than several nanometers, can be clearly observed by means of GBSH mode. Secondary electron image resolution: 0.8 nm (accelerating voltage 1.0 kV GBSH mode)  Accelerating voltage: 0.01 ∼ 30 kV GBSH specimen holder: 28 mmφ × 10 mmh (Max)...