www.connect.co.jp www.jccherry.com Image Sensor Test Socket High current High speed interface Specification(typical) Features: pitch : 0.25mm ～ ●Test socket for CCD and CMOS sensor diversified in recent years. Rate Current : 0.5A ～ ●Customizable for various package like BGA, LGA, PGA Contact Resistance : 200mΩ max and for manual, handler and burn-in. Dielectric Strength Voltage : AC100V rms 1 min ●The test socket is made of anti-reflective material and it has Insulation Resistance : 1000MΩ min at DC100V an aperture on the top surface. Temperature Range : -40℃ ～ +150℃ ●Using our high reliable spring probes, stamping pins and socket pins,we manufacture test sockets for high current, high durability and high speed interface. Open top type For manual product evaluation and mass-production with handler A probe pin socket with device height variability absorption mechanism. A probe pin socket for the light source above of socket. A probe pin socket for the light source under of socket. Return loss Insertion loss A probe pin socket for the high speed interface Pitch:1.27mm Return loss(GSG):-14.01dB＠14.23GHz Insertion loss(GSG):-1.0dB＠14.23GHz Self inductance:0.95nH Ca

www.connect.co.jp www.jccherry.com Clamshell type For manual product evaluation and mass-production with handler For various evaluation and mounting production Thru Hole Solder Dip Socket pin Solder Dip type