SYSTEMS & SOLUTIONS IR Measurement Portfolio & Solutions Instrument Systems KONICA MINOLTA Group

Infrared (IR) is defined as electromagnetic radiation (800 nm - 1 mm range) with wavelengths longer than those of visible light. The relevant range for radiation measurement is the near-infrared range (NIR) from 800 - 1400 nm and the short-wavelength IR (SWIR) from 1400 - 3000 nm. Especially the use of VCSEL (surface emitting laser) has enabled many new applications for consumer equipment and in the field of 3D sensing. Visible radiation Ultraviolet radiation Infrared radiation y 3D sensing in consumer electronics: y - Facial recognition (structured light) y y 3D sensing in automotive / industry:...

We offer an extensive portfolio that covers the IR radiation measurement as well as the other aspects related to the control of the device under test (DUT). Our key benefits are highest accuracy combined with a high modularity and therefore high flexibility. Based on the application requirements we create a system solution by combining hardware and software. The table below shows the key items of a system. Software Software Probe Probe y ontrols measurement equipment and C other system components y rovides results and reporting P Radiometric measurement equipment & calibration y ptical measurements...

The table below shows which measurements are possible with our different systems. 2.1 Systems with spectrometer and radiometer / photo diode With the Pulsed VCSEL Testing System (PVT) we offer a solution specifically for nanosecond pulse driving and measurement as used for LiDAR or Time-of-Flight (ToF) applications. For all other applications, we can flexibly combine equipment and software to a system solution that meets the application requirements (Modular Test System). Our modular spectrometers can be combined with a wide range of interchangeable measurement probes that are connected by a...

Modular Test System Pulsed VCSEL Testing System (PVT)Applications Y For laser sources / VCSEL, LEDs and other emitter Y Range 200 - 2150 nm Y Pulse driving and time-resolved measurement > 1 ps possible Y High flexibility thanks to modularity Y For VCSEL used for 3D sensing (LiDAR, ToF) Y Range 800 - 1000 nm Y Nanosecond pulse driving and measurement Y Total system for lab measurement or components for in-line testing Radiometric measurement equipment Power source Calibration standard Y ACS NIR standard for radiant flux (860 / 950 nm) Y ACS NIR standard for radiant flux (860 / 950 nm) Instrument...

Camera based equipment allows two-dimensional measurements with each camera sensor pixel being a measuring spot. We offer two products for NIR VCSEL measurement. Both products can finish the measurement task much faster with one shot instead of multiple measurements as with alternative solutions. Y Angular distribution measurement for VCSEL Y Faster than goniometer Y Range 800 - 1000 nm Applications Y 2D analyse of single VCSEL emitters on an array Y Power measurement (range 900 - 980 nm) Y Optional peak wavelength measurement with spectrometer Software Instrument Systems ► IR Measurement Solutions...

Light measurement accessories (for spectrometer) Instrument Systems ► IR Measurement Solutions 7 //

Calibration and monitoring equipment DUT Electrical driving and measurement Instrument Systems GmbH fax: +49 (0)89 45 49 43-11 | | Kastenbauerstr. 2 | 81677 Munich, Germany | ph: +49 (0)89 45 49 43-58 [email protected] | www.instrumentsystems.com