Lieo The first turnkey solution for the complete characterization of miniature optical components with pupils ranging from 1.5-12 mm in diameter - regardless of their numerical aperture (NA). fully automated Օ compact, space saving design precision wavefront characterization Օ BFL, EFL, chromatism, field curvature, distortion, vignetting, relative illumination 3D and through-focus MTF ^| Imagine Optic SA (main office) 18 rue Charles de Gaulle 91400 Orsay France Telephone: +33 (0)1 64 86 15 60 Fax: +33 (0)1 64 86 15 61 E-mail: [email protected] Imagine Optic, Inc. (North America) Cambridge Innovation Center ^ One Broadway, 14th floor Cambridge, MA 02142, USA jST Telephone: 1-617-401-2198 Fax: 1-617-930-9818 W 2415 Third Street San Francisco, CA 94107 Telephone: 1-415-525-5557 Fax: 1-415-525-5558 E-mail: [email protected] ^ COSINGO (Imagine Optic Spain SL) Mediterranean Technology Park Av. del Canal Olimpic s/n 08860 Castelldefels (Barcelona) Spain Telephone: +34 935 534 148 Fax: +34 935 534 000 E-mail: [email protected] 0 կ © 2010 Imagine Optic SA. All rights reserved. Imagine Optic, the products, the companies and the services mentioned in this media are trademarks and/or registered trademarks of Imagine Optic and/or their respective owners. Communications by Elucido Partners www.elucido-partners.net

TM neo Total prcision wavefront characterization of miniature optics and objectives that allows you to measure aberrations, back focal length (BFL), effective focal length (EFL), chromatism, field curvature, distortion, vignetting, relative illumination as a function of the field, calculate the 3D MTF, and, even more, the MTF through-focus for all measured points in the field as well as determine the best focal plane. The SL-Sys neo is a unique lens characterization solution designed for industrial R&D programs and for production line quality control. Based on Imagine Optic's industry leading...