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Shack-Hartmann wavefront analysis - SWIR optical metrology Application Notes

Shack-Hartmann wavefront analysis - SWIR optical metrology Application Notes

Shack-Hartmann wavefront analysis - SWIR optical metrology Application Notes

Product catalog summary
Overview
The document discusses the Shack-Hartmann wavefront sensors, which are based on principles proposed by Hartmann in the 19th century and later improved by Shack and Platt in 1971. Imagine Optic has further enhanced this technology with proprietary features like Dynamic Spot Tracking™ and Auto Spot Finder™ to improve the dynamic range of their HASO wavefront sensors.

Introduction
The Shack-Hartmann wavefront analysis involves measuring aberrations in a light source by passing it through a screen of apertures, decomposing it into points relative to specific zones. Shack and Pratt improved this by using microlenses to focus the wavefront onto a CCD camera grid, creating multiple elementary beams.

Working Principle
Figure 1 illustrates the function of HASO Shack-Hartmann sensors, where the distance between the microlens array and the CCD detector grid is crucial for calculating the wavefront's local slopes and displaying the phase map. Figure 2 shows the reconstruction of 2D and 3D wavefront images.

Precision and Myths
The document dispels myths about Shack-Hartmann technology, such as "crossing spots" and chromatic effects. It explains that large aberrations do not mislead the sensors due to the continuous derivative of wavefronts. HASO sensors discard data when aberrations exceed measurable limits, unlike inferior devices that may provide erroneous data.

Chromatic Effects
HASO sensors are designed to handle chromatic effects through patented fabrication techniques, ensuring precision regardless of the wavelength. The fixed distance between the microlens array and the CCD detection plate is key to accurate measurements.

Key Features
HASO technology features include design optimization, high-quality microlens arrays, precise coupling between camera and microlens array, robust mechanical assembly, wide-range spot detection algorithms, and rigorous calibration and testing procedures.

For further information, visit Imagine Optic's website.
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Catalog excerpts

Shack-Hartmann wavefront analysis - SWIR optical metrology Application Notes-1

Shack-Hartmann wavefront analysis Imagine Optic, 18 rue Charles de Gaulle, 91400 Orsay, France [email protected] Introduction Imagine Optic™ HASO™ wavefront sensor hardware and software technologies are based on the Shack-Hartmann principal. HASO is optimized at every stage of production from design and manufacturing through to calibration and meticulous quality control. Overview Shack-Hartmann wavefront sensors are based upon the principals proposed late in the 19th century by a German physicist named Hartmann. At that time, the instruments needed to bring that idea to life had not yet been conceived. In 1971, when technology had matured to a point where putting Hartmann’s idea into action became possible, two American scientists named Shack and Platt improved on Hartmann’s idea and built the first wavefront sensor of this type, calling it a Hartmann-screen. Since then, it has become commonly known as Shack-Hartmann and is considered around the world to be the technique of choice for precision wavefront metrology. Imagine Optic has further improved on this technique by incorporating several proprietary technologies, including Dynamic Spot Tracking™ and Auto Spot Finder™, to increase the HASO family of wavefront sensors’ dynamic range. Shack-Hartmann wavefront analysis N.Varkentina imagine-optic.com 6 October 2020 – Property of

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Shack-Hartmann wavefront analysis - SWIR optical metrology Application Notes-2

Hartmann’s idea was to measure the aberrations Figure 1 illustrates how HASO Shack-Hartmann (imperfections) present in a luminous source by wavefront sensors function. In this diagram, d is the passing it through a screen of apertures that would distance between the microlens array (principal spatially decompose it into the equivalent number of image plane) and the CCD detector grid, i is the points, each point being relative to a specific zone of number of the microlens in the array, and ∆x is the the incoming source. To do this, he would have to intersection point of the elementary beam on...

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Shack-Hartmann wavefront analysis - SWIR optical metrology Application Notes-3

We would like to take this opportunity to dispel two exceptional dynamic range, no sensor can claim to technology. The first being “crossing spots,” or the measure any and all aberrations regardless of their claim that these wavefront sensors can be misled magnitude. When a HASO device encounters this when measuring highly aberrated wavefronts. type of situation, the data is discarded and no This first erroneous claim purports that large aberrations in the source would be misinterpreted by the device as light from a different microlens and measurement is provided for that measurement point. In...

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Shack-Hartmann wavefront analysis - SWIR optical metrology Application Notes-4

In short, HASO Shack-Hartmann wavefront sensors are the most reliable means of using wavefront sensing and analysis to achieve precision results every time you use them – even on the most highly aberrated, convergent or divergent beams. Key HASO technology features • • • • • • Design optimization using wave propagation and signal detection modeling High-quality microlens array Ultra-precise coupling between camera and microlens array Robust bulk mechanical assembly Wide-range spot detection algorithms Rigorous calibration and test procedure For more information, and to find the Imagine Optic...

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