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SH-LTP (Shack-Hartmann Long Trace Profiler

SH-LTP (Shack-Hartmann Long Trace Profiler

SH-LTP (Shack-Hartmann Long Trace Profiler

Product catalog summary
Overview: The Shack-Hartmann Long-Trace Profiler (SH-LTP) is designed for precise 2D surface characterization of large optical components and semiconductor wafers. It offers superior accuracy through stitching methods and sub-microradian performance, with a simple, compact, and robust design.
Specifications:
  • Aperture dimension: 11.7 x 11.7 mm²
  • Number of sub-apertures: 26 x 26
  • Tilt dynamic range: ± 1°
  • Radius of curvature dynamic range: ± 0.7 m to ± ∞
  • Slope measurement sensitivity: <0.1 µrad
  • Slope measurement accuracy: 0.1 µrad
  • Tilt measurement sensitivity: 0.05 µrad
  • Curvature measurement sensitivity: 5.10-5 m-1
  • Spatial resolution: 450 µm
  • Max acquisition frequency: 7.5 Hz
  • Working wavelength: 405 nm
  • Working temperature: 20 - 25°C
  • Dimensions/weight: 350 x 287.5 x 150.25 mm / 5 kg
Applications: The SH-LTP is ideal for surface metrology, post-polishing control, spatial quality control of light beams, and high-accuracy non-contact measurement of curvature in optical components and semiconductor wafers.
Technology: The SH-LTP uses a 405 nm illumination system and a high-accuracy Shack-Hartmann wavefront sensor with patented rotated-square technology for increased spatial resolution. It is compatible with the StitchWave™ software for accurate surface measurement.
Software Features:
  • HASOv3: Aligns the SH-LTP with the surface and manages translation stages.
  • StitchWave™: Reconstructs local slopes and surfaces through stitching and numeric integration, displaying 2D mappings with PV and RMS indicators.
  • Additional functionalities include filtering aberrations, extracting sub-regions, and averaging acquisition files.
Contact Information: Imagine Optic has offices in France, North America, and Spain, providing contact details for inquiries and support.
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Catalog excerpts

SH-LTP (Shack-Hartmann Long Trace Profiler-2

Shack-Hartmann Long-Trace Profiler The ideal solution for: Surface metrology and characterization of large optical components and semiconductor wafers (synchrotron x-ray optics, silicon wafers, optics for aerospace applications) Օ Post-polishing control and surface local finishing Spatial quality control of light beams Օ High-accuracy, non-contact measurement of the radius of curvature along orthogonal directions (surface astigmatism) in one single procedure Imagine Optic's Shack-Hartmann Long-Trace Profiler (SH-LTP), developed in conjunction with the SOLEIL synchrotron, is the ideal solution...

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SH-LTP (Shack-Hartmann Long Trace Profiler-3

s ^| Imagine Optic SA (main office) 18 rue Charles de Gaulle 91400 Orsay France Telephone: +33 (0)1 64 86 15 60 Fax: +33 (0)1 64 86 15 61 E-mail: [email protected] Imagine Optic, Inc. (North America) Cambridge Innovation Center ^ One Broadway, 14th floor Cambridge, MA 02142, USA jST Telephone: 1-617-401-2198 Fax: 1-617-930-9818 W 2415 Third Street San Francisco, CA 94107 Telephone: 1-415-525-5557 Fax: 1-415-525-5558 E-mail: [email protected] ^ COSINGO (Imagine Optic Spain SL) Mediterranean Technology Park Av. del Canal Olimpic s/n 08860 Castelldefels (Barcelona) Spain Telephone:...

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