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MESO Metrology System Datasheet

MESO Metrology System Datasheet
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Interferometry Applications Metrology solution Simpler, faster & more robust Insensitive to vibrations At-wavelength metrology Parallel optics testing

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MESO New metrology solution for easy at-wavelength testing of flat surfaces in any environment MESO is the perfect tool for the characterization of: + Parallel Optics + Screens + Filters, dichroics + Mirrors + Beamsplitters + Windows, substrates + Corner cubes + Crystals + Rods, disks + Glass wafers + Displays + Machined surfaces + Windshields + Prisms + Large lenses + Optical systems, beam expanders APPLICATIONS + In situ process control + Thin Parallel Optics characterization + Transmitted wavefront quality (TWE) + Surface shape & flatness measurement (RWE) + Large optics testing + Wedge...

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SPECIFICATIONS OPERATING SPECS Phase point resolution Minimum exposure time Calibrated range Working output wavelengths Output polarization Operating system 680 x 500 27 ms 405 nm to 830 nm 405 nm, 488 nm, 520 nm, 635 nm, 785 nm, 830 nm, custom optional linear, circular high performance DellTM computer & 24’’ touchscreen, Windows 10, WAVESURFTM acquisition control & analysis software OPTICAL SPECS Optical configuration Test beam diameters Optical axis double-pass optical zoom from 1.5’’ (38.1 mm) up to 6’’ (152 mm) 4.25” (108 mm) MISC Dimensions (Height x Width x Length) Weight Mounting...

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SOFTWARE WAVESURFTM Easy-to-use interface WAVESURFTM allows operators and engineers in manufacturing environments to perform wavefront and surface characterization of flat optics and large lenses with just a few clicks. Scripted testing procedures guide users through all the steps. It makes control easy, automated and error-proof. + Touchscreen interface control + Scripted testing procedures guide the user through all the steps + Automated control of up to 4 embedded wavelengths + Automated control of test diameter (optical zoom) + Complete automated test report + ISO10110 standard...

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