CAMSQUARED Metrology System Datasheet
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Catalog excerpts

CAMSQUARED Metrology System Datasheet - 1

SQUARED M2 meter The smart one Compact Alignment-Free Ultra short measurement cycle

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CAMSQUARED Metrology System Datasheet - 2

A great choice for almost any lab or industrial application, the C A M SQUARED is Imagine Optic’s innovative answer to the need for laser quality testing and M2 measurement. Finally an M2 meter as easy and quick to set up as a beam profiler. Laser beam quality testing is of utmost importance in many laserbased applications where beam waist and beam divergence matter: + Manufacturing, machining, welding for fluence + Imaging, for resolution + Fiber optics, for coupling + Free space optical communications and laser radar systems (LIDAR) for better propagation through turbulent atmosphere. CAM...

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CAMSQUARED Metrology System Datasheet - 3

SPECIFICATIONS OPERATING SPECS Aperture dimensions Recommended beam diameter Maximum acquisition frequency Wavelength range Minimum power External trigger Operating system Measurement cycle time Travel range Typical M2 accuracy Pulsed sources Damage thresholds 6.9 x 5.1 mm² (L) 4.5 x 3.7 mm² (M) min.: 0.8 mm @ 1/e3 (0.7 mm @ 1/e2) max. (L): 5 mm @ 1/e3 (4.5 mm @ 1/e2) max. (M): 3.6 mm @ 1/e3 55 Hz (L) 125 Hz (M) 350 - 1100 nm 0.15 nW TTL signal Windows 10 & 11 ~ ms typically, depending on settings not limited by translation stage 5% full compatibility 100 mW / cm2 in CW mode 100 uJ / cm2 in...

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CAMSQUARED Metrology System Datasheet - 4

SOFTWARE Application M2 based on WAVEVIEWTM Metrology Software + Optimized display of laser quality metrics + Optional phase measurement extension for wavefront diagnostic and analysis (alignment, collimation, optical aberrations analysis and more than 150 features) + Optional SDK in C/C++, LabVIEW and Python ACCESSORIES + Several mounting options are available, including adapters for the most common mechanical stages and magnetically coupled top and bottom plates, allowing to mount, remove, and replace C A M SQUARED with a high repeatability. APPLICATION NOTES + M2 measurement with C A M...

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