OMNI TERS Probes
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Catalog excerpts

Unique Features Omni™ Tip-Enhanced Raman Spectroscopy (TERS) probes are designed to acquire topography and Raman spectral information of a sample simultaneously. The combination of HORIBA's Nano-Raman system with Omni™ TERS probes provides the ideal high enhancement TERS solution. • Allow all modes of TERS operation: Top, side and bottom optical access • Multilayer structure Tip optimized to minimize interference from silicon material in the spectra • Innovative package to enhance tip shelf life • Raman active layer: Ag with protective layers Explore the future Automotive Test Systems I Process & Environmental I Medical I Semiconductor I Scientific HORIBA

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• Topography scan of the graphene oxide flake • Combined TERS map of the D band Part Number HORIBA Scientific *Omni TERS Probes are packaged and sealed in an inert gas before shipping. TERS Tips Performance* • Enhancement factor ~ 106 • 9 out of 10 probes to provide the nano-resolution *Guaranteed on HORIBA test TERS samples: carbon nanotubes and graphene oxide on gold substrate Typical TERS spectra taken over the flat portion (blue) and wrinkles (red) This document is not contractually binding under any circumstances - Printed in France - ©HORIBA Jobin Yvon 04/2016 Automotive Test Systems...

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