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HF HD-960L

HF HD-960L

HF HD-960L

Product catalog summary
Introduction
The document details the HD-960L dissolved oxygen monitor, specifically designed for semiconductor wet processes involving chemicals such as hydrofluoric acid (HF) and tetramethyl ammonium hydroxide (TMAH). Monitoring dissolved oxygen is essential as it influences wafer processing, etching speed, and device characteristics.

Measurement Principle
The monitor employs a membrane polarographic method using an electrochemical sensor with an anode, cathode, and guard electrode. Oxygen permeates a gas-permeable membrane and is reduced at the cathode, producing a signal proportional to the oxygen concentration.

Innovations for Low Concentration Measurement
A guard electrode prevents dissolved oxygen in the electrolyte from reaching the cathode, ensuring rapid response times in low concentration settings. A current-restricting resistor is used to avoid unnecessary electrolyte consumption at high oxygen levels.

High-Temperature Measurement
The sensor can handle samples up to 60°C. Adjustments in membrane size and electrolyte volume counteract response deterioration due to temperature-induced pressure changes.

Flow Chamber Structure
The flow chamber reduces chemical sampling volume and includes a magnetic stirrer to maintain accurate measurements even at low flow rates. It is constructed from PFA for compatibility with semiconductor processes.

Performance and Benefits
The monitor delivers stable measurements unaffected by chemical concentration variations. It provides high-speed response and linear signal output across different dissolved oxygen concentrations. The guard electrode also prevents metal deposition on the cathode.

Conclusion
The HD-960L monitor effectively addresses challenges in measuring dissolved oxygen in semiconductor processes, enhancing quality and yield. Its design supports high temperatures and chemical resistance, making it suitable for future complex semiconductor manufacturing needs.
Specification Overview
  • Model: Amplifier HD-960L, Sensor Unit DO-100, Sensor 5600
  • Measuring Principle: Membrane Polarography
  • Measuring Range: 200.0 µg/L to 20.00 mg/L
  • Measurement Cycle: 1 second
  • Repeatability: +/- 1% Full Scale (FS)
  • Linearity: +/- 1% FS
  • Response Time (T90): 30 seconds
Sample Conditions
  • Flow Rate: 15 to 200 mL/min
  • Temperature: 10 to 45 degrees Celsius
  • Pressure: 0 to 0.1 MPa
  • HF Concentration: Less than 5000 ppm
Wetted Material
  • Sensor Body: Polypropylene (PP)
  • Membrane: Fluorinated Ethylene Propylene (FEP)
  • Flow Chamber: Perfluoroalkoxy (PFA)
Facility Requirements
  • Power Supply: DC 24V
  • Purge Gas: Nitrogen (N2)
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Catalog excerpts

HF HD-960L-1

Feature Article Dissolved Oxygen Monitor (HD-960L) for Semiconductor Wet Process Dissolved Oxygen Monitor (HD-960L) for Semiconductor Wet Process Performance of the Dissolved Oxygen Monitor Used in the Semiconductor Wet Process; Low Concentration Monitoring, High Temperature, Small Amount of Sampling Volume, Chemical Resistance Kentaro INOUE The HD-960L dissolved oxygen monitor was launched for etching chemicals (HF and TMAH aqueous solutions) in semiconductor wet processes. The polarographic sensor has a guard electrode to improve the response in the low-concentration range. Optimizing the concentration of the electrolyte solution volume and configuring a current-restricting resistor for the guard electrode made it possible to measure high-temperature solutions and extend the life of the electrolyte solution. The evaluation test results showed that the saturated dissolved oxygen signal is not affected even if the chemical concentration changes, that the response to the concentration changing in the low-concentration range was fast enough, and that the signal was linear with respect to the concentration. A magnetic stirrer was installed in the flow chamber, which made it possible to take stable measurements of the dissolved oxygen, even in cases of samples with low flow rates. Introduction In semiconductor device manufacturing processes, aqueous solutions of substances such as hydrofluoric acid and TMAH (tetramethyl ammonium hydroxide) are used. The chemicals used in these processes normally contain a few μg/L to a few mg/L of oxygen, and it has been pointed out that this oxygen dissolved in the chemicals affects wafer processing. The speed of etching using TMAH and the surface uniformity are related to the dissolved oxygen concentration, and it has been found that this can affect finishing, and the dissolved oxygen in the hydrofluoric acid can corrode the copper wires and cause the device characteristics to deteriorate. As such, there is an increased need to monitor the dissolved oxygen in these chemicals. Cutting off the oxygen in the atmosphere can be achieved by purging the nitrogen, but when the oxygen in the chemicals also needs to be controlled at a low concentration, it needs to be checked using a dissolved oxygen concentration monitor. Here we would like to introduce the performance and structure of our dissolved oxygen monitor (HD-960L) for low concentrations and high temperatures that is specialized for chemicals used in semiconductor device manufacturing processes. English Edition No.47 June 2017 Measurement principle (membrane polarographic method) This dissolved oxygen monitor uses an electrochemical sensor that operates with the membrane polarographic method, and the sensor is composed of an anode, a cathode, and a guard electrode. The area inside the sensor is filled with electrolyte solution, and the area between the fluid to be measured and the sensor is segregated by a gas-permeable polymeric membrane. When the oxygen gas has passed through the membrane that separates the aqueous solution to be measured and the electrode, and diffusion allows it to reach the cathode (Au) covered by a thin electrolyte solution coat, the oxygen receives electrons from the cathode, is reduced, and becomes hydroxide ions. With the anode (Ag), part of the anode is oxidized, is ionized, and breaks away from the anode, and at the same time, leaves electrons on the anode. At this time, electrons move from the anode to the cathode, so if measurements are taken with an ammeter, a signal can be obtained that is proportional to the number of the reaction associated with the oxygen gas reduction per unit time. The main components of the electrolyte solution are a KCl aqueous solution with a pH buffer added to decrease the changes in pH that go along with the reaction. To promote the reaction, the cathode electrode is applied about -0.6 V with respect to the anode. The chemical reaction associated with oxygen gas reduc-

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HF HD-960L-2

Technical Reports tion is shown below. Cathode: O2+4e-+2H2O → 4OHAnode: 4Ag+4KCl+4OH- → 4AgCl+4KOH+4e- Current meter The chloride ions are consumed along with the reaction, which leads to the electrolyte solution having a life. At the same time, the silver on the anode gradually oxidized, but the anode has a sufficient amount secured, so this can be ignored compared to the consumption of the electrolyte solution. If the sample is a solution of hydrofluoric acid or TMAH, etc., the ions can’t move through the membrane, so they don’t affect the reaction. It is possible to correct the salinity if...

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HF HD-960L-3

eature Article Dissolved Oxygen Monitor (HD-960L) for Semiconductor Wet Process Saturated DO signal with stirrer on/off 8 7 6 5 4 3 2 1 0 0 100 200 300 Sample flow rate mL/min Figure 3 Efficacy of the imbedded stirrer resulted from evaluation test (Possible to measure in low flow rate) Measuring high-temperature samples The sensor can measure high-temperature samples up to 60°C. When the temperature of the fluid supplied to the sensor increases, the volume of the electrolyte solution increases and the internal pressure increases, which causes force to push the membrane from the inner...

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HF HD-960L-4

HORIBA Technical Reports Figure 8 Linearity of DO in low concentration Product specifications and appearance Figure 9 shows the product appearance, and Table 1 shows the specifications. Readout English Edition No.47 June 2017

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HF HD-960L-5

eature Article Dissolved Oxygen Monitor (HD-960L) for Semiconductor Wet Process (a) sensor unit: DO-100 Figure 9 Outline view of Dissolved Oxygen monitor Table 1 Abstract of the specification than chemical concentrations, such as dissolved oxygen, will become more and more important, in addition to the conventional chemical concentration measurements. We hope that this dissolved oxygen monitor will contribute to improving the quality and yield of semiconductors. Conclusion A major feature of this product is that a resistor has been applied to the guard electrode that enables it to control the consumption...

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