Universal Extensions for CathodoLuminescence, Boost your Electron Microscope with Hyperspectral & Imaging Solutions Explore the future Automotive Test Systems I Process & Environmental I Medical I Semiconductor I Scientific HORIBA

Clue Series Optoelectronics Semi-conductors Geology Mineralogy Add Cathodoluminescence and Raman Capabilities to your Electron Microscope Gain unique insight into the chemical and electronic properties of materials with nanoscale resolution! HORIBA Scientific is your partner in spectroscopy with unequalled experience in optics, vacuum and detectors designs. Based on combined experience in Japan (MP series) and in France (CLUE series), HORIBA Scientific offers a bunch of cathodoluminescence systems for process applications in semiconductors as well as Research applications in Earth, Life and Material...

Add-on Detectors PortfolioAn ultra-compact scalable solution to fit any request and budget Keep the original configuration of your electron microscope EBSD* offers a cathodoluminescence solution to every customer and every sample. In addition, our special product team can develop a custom solution to meet your specific requirements. From i-CLUE affordable CL panchromatic imaging controlled by the electron microscope software, to F-CLUE fiber coupled ruggedized configurations and H-CLUE laboratory solutions featuring high performance direct coupling; HORIBA Scientific Because it is fully retractable,...

The Best of Spectral Analysis Ultimate User Experience with LabSpec 6 Software For High Resolution Cathodoluminescence Images Unveil every detail of minerals and zircons with high resolution CL images. Map opto-electronic properties with nanometric scale resolution and reveal the true nature of ceramics, photonic nanomaterials, LED or photovoltaics thin-films, 2D heterostructures… The core of the CLUE series is LabSpec 6TM software, concentrating the power of advanced spectrum analysis, the best imaging and automation and unrivaled ease of use. LabSpec 6TM stands at the forefront of mosaic visualization,...

This document is not contractually binding under any circumstances - Printed in France - ©HORIBA FRANCE 05/2017 A = 325-1064nm P < 500mW VISIBLE AND/OR INVISIBLE LASER RADIATION AVOID EXPOSURE TO BEAM CLASS 3B LASER PRODUCT Explore the future Automotive Test Systems I Process & Environmental I Medical I Semiconductor I Scientific