Harmful Element Fluorescence X-ray Inspection Instrument XGT-1000WR Compliant with WEEE and RoHS Directives

Proposals from the XGT Series Simply place the sample directly into the sample chamber. The X-ray irradiation diameter is 1.2 mm, so even small parts can be measured as is. The XGT series makes it easy for anyone to perform precise measurements. The area to be tested can be specified easily, even for parts with multiple plastic sections, by observing the sample using the 50X CCD camera. The XGT provides greater X-ray intensity. That is the secret to the high-precision analysis and quick analysis of the XGT Series. The XGT-1000WR employs HORIBA's original X-ray beam condensation technology and...

Just press the button to perform the analysis automatically. The analysis results are displayed quickly and accurately. The result of the incorporation of numerous original HORIBA technologies. Lower Detection Limits Compliant with WEEE and RoHS Directives Directive based on EC175 promoting the separate collection of electrical and electronic equipment as well as their recycling and recovery. Individual countries in the EU may also enact their own stricter domestic policies. Directive based on EC95 prohibiting the use of six substances -- lead, mercury, cadmium, hexavalant chromium, polybrominated...

Measurement Principle Energy Dispersive Fluorescence X-ray Analysis Method Elements Measured Si to U (Cd/Pb high-sensitivity model) 1.2 mm probe: Si to U 0.1 mm probe: Na to U (When selecting the 1.2 mm/0.1 mm diameter switching method) Lower Detection Limit (Cd/Pb) X-ray Radiation Diameter Sample Shape Maximum Size: 460 X 360 mm (height: 150 mm) Sample Chamber Atmosphere Normal Atmospheric Pressure X-ray Tube Tube Voltage Tube Current XEROPHY High-Purity Si Detector Dewar Capacity Liquid Nitrogen Consumption 1 liter or less per day (no replenishment needed during storage) Optical Image Observation...