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AFM Raman

Product catalog summary

Laser Specifications and Safety:
The document specifies a laser product with a wavelength range of 325 nm to 1064 nm and a power limit of 500 mW. It is classified as a Class 3B laser, indicating potential hazards and the need to avoid direct exposure to the beam.

Integrated Software Features:
The system offers simple and fast operations with one-click cantilever alignment, frequency tuning, and optimization without manual adjustments. It allows easy cantilever exchange and fast Raman laser to AFM tip alignment, enabling ultra-fast simultaneous SPM and Raman measurements.

System Capabilities:
The system is equipped with high numerical aperture objectives for optimal spatial resolution and TERS collection efficiency. It features high-throughput optics, a high spectral resolution spectrograph, and a broad detection wavelength range from deep UV to infrared. The system supports simultaneous SPM and spectroscopic measurements with powerful processing software for data analysis.

Design and Performance:
The system includes a 1300 nm AFM laser feedback, dual optical scheme, and closed-loop Raman laser alignment for stability. It offers high resonance scanning, auto tip-alignment, and tuning without active vibration isolation. The compact holder facilitates easy probe exchange.

Data Acquisition and Analysis:
The interface supports scripting and method definition capabilities, integrated multivariate analysis, and high-level analysis with PCA, MCR, HCA, and DCA. The KnowItAll® HORIBA Edition provides fast chemical identification with a spectral database.

Nano-Spectroscopy Solutions:
The system supports AFM-Raman, TERS, and NSOM for chemical imaging at the nanoscale. It offers numerous SPM modes and a full range of Raman excitation lasers. The system can operate with up to three spectroscopic detectors and 20 SPM channels.

Applications:
The system is suitable for analyzing biological structures, graphene, carbon nanotubes, nanowires, polymers, SERS substrates, and semiconductors.

Conclusion:
The integration of SPM and optical spectroscopy provides a powerful tool for physical and chemical characterization at the nanoscale, offering label-free chemical sensitivity and high-resolution imaging.

Catalog excerpts

H igh numerical aperture objectives from both top and side for best co-localized spatial resolution and best TERS collection efficiency. High-throughput optics and spectrometer. High spectral resolution with the LabRAM HR spectrograph. B road range of detection wavelengths, from deep UV to Infrared. Simultaneous SPM and spectroscopic measurements. Powerful processing software suite for both SPM and spectroscopic data, including Multivariate Analysis and spectral database lookup. Integrated Software Seamless system control and data acquisition, and the most advanced data analysis and processing suite AFM-Raman, TERS, NSOM Chemical imaging at the nanoscale Dual optical scheme, easy switching High efficiency top down and side coupling Integrated Multivariate Analysis module. High level analysis at a touch of a button. PCA | MCR | HCA | DCA. 5 KnowItAll® HORIBA Edition. Fast chemical identification with HORIBA spectral database (>1750 spectra). High performance without active vibration isolation Powerful data acquisition and system control interface with scripting and methods definition capabilities. High resonance scanner, auto tip-alignment and tuning Closed-loop, short path-length Raman laser alignment for long-term stability O ne-click cantilever alignment, frequency tuning and optimization, requiring no manual adjustments. E asy cantilever exchange without affecting the sample. F ast and intuitive Raman laser to AFM tip alignment. U ltra-fast simultaneous SPM and Raman measurements. VISIBLE AND OR INVISIBLE LASER RADIATION AVOID EXPOSURE TO BEAM CLASS 3B LASER PRODUCT * Laser safety classifications depend on individual systems and options Visual confirmation of Raman laser alignment in all modes This document is not contractually binding under any circumstances - Printed in France - ©HORIBA Jobin Yvon 08/2013 Compact holder for easy probe exchange

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Since its introduction in the early 80’s, Scanning Probe Microscopy (SPM) has quickly made nanoscale imaging an affordable reality. The technique provides a continuously growing variety of surface analysis methods for the physical characterization of materials, yet label-free chemical sensitivity is still challenging. Main Applications for Physical and Chemical Characterization Made Easy! Raman-AFM On the other hand, optical spectroscopy has provided a unique way to determine the structure and chemical composition of molecules for decades and is a method of choice for the analysis of nano-materials...

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AFM Raman

AFM Raman

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