ZoneSEMII & ZoneTEMII

ZoneSEMII & ZoneTEMII

ZoneSEMII & ZoneTEMII

Product catalog summary
Introduction
The document discusses the challenges faced by SEM and TEM users due to hydrocarbon contamination during high-resolution imaging. This contamination is primarily caused by gaseous hydrocarbons deposited by the electron beam, often due to suboptimal chamber vacuum conditions.

Contamination Sources and Solutions
While plasma cleaners can improve vacuum conditions, they may be too harsh on samples. Hitachi offers a gentler solution with their ZONE cleaners, which use ultraviolet light and free oxygen radicals to remove hydrocarbons without damaging samples.

Product Features
  • UV lamps with wavelengths of 185nm and 254nm are used to break hydrocarbon bonds and generate ozone.
  • An integrated diaphragm pump creates a moderate vacuum adjustable between 13 and 67kPa, optimizing the cleaning mechanism.
  • Capacity for up to 5 TEM sample holders, with configurable options.
  • Cleaning and storage functions with a recipe memory.
  • Suitable for samples up to 100mm in diameter and 37mm in height.
  • Typical process times range from 5 to 15 minutes.

Additional Information
For further guidance, potential users are encouraged to contact Hitachi experts or visit their website for more information. The document also includes a disclaimer about the use and reproduction of the content, emphasizing that specifications may change without notice.

Contact Information
Website: www.hitachi-hightech.com
Email: [email protected]
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Catalog excerpts

ZoneSEMII & ZoneTEMII-1

Sample Preparation and Cross-Section Preparation

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ZoneSEMII & ZoneTEMII-2

UV-Ozone Sample Cleaner for SEM and TEM ZoneSEM II Product Features - For samples up to 100mm Ø and 37mm high - Cleaning and storage function Gentle removal of hydrocarbon contamination - Recipe memory - Typical process times 5-15 minutes SEM and STEM / TEM users know the problem: High-resolution imaging is often impaired (if not made completely impossible) by the rapid build-up of a carbon film in the observation area. This is usually caused by gaseous hydrocarbons that are continuously deposited during observation due to the energy transfer of the electron beam. The source of these hydrocarbons...

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ZoneSEMII & ZoneTEMII-3

Not sure which product aligns with your needs? Our experts are here to provide guidance and help you make the best choice. Speak with an expert More information This publication is the copyright of Hitachi High-Tech Europe GmbH and provides outline information only, which (unless agreed by the company in writing) may not be used, applied or reproduced for any purpose or form part of any order or contract or regarded as the representation relating to the products or services concerned. The content is provided for general information purposes only. Hitachi High-Tech Europe GmbH’s policy is one...

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