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SU7000 | Ultra high resolution Schottky SEM

SU7000 | Ultra high resolution Schottky SEM

SU7000 | Ultra high resolution Schottky SEM

Product catalog summary
Overview of SU7000 Scanning Electron Microscope
The SU7000 is a next-generation Field Emission Scanning Electron Microscope (FE-SEM) designed to meet the diverse needs of modern electron microscopy. It offers high performance with functionalities such as wide-area observation, in-situ analysis, variable pressure, and high-resolution imaging at low accelerating voltages.
Key Features
  • Versatile Imaging Capability: Fast acquisition of multiple signals for a wide range of SEM needs, from wide field views to sub-nanometer structures.
  • Multi-Channel Imaging: Capable of processing and displaying up to six signals simultaneously to maximize information acquisition.
  • Observation Techniques: Optimized for large specimen sizes, sample manipulation, variable pressure, cryogenic conditions, and in-situ heating and cooling.
  • Microanalysis: Equipped with a Schottky emitter providing up to 200 nA beam current, supporting various analytical options like EDX, WDX, EBSD, and cathodoluminescence.
Imaging Performance
  • Enhanced detection system for structural, topographical, compositional, and crystallographic information.
  • Simultaneous image acquisition for surface micro-structural, coating, and topographic information.
Display and Interface
  • Customizable display modes with single and dual-monitor configurations.
  • Intuitive graphical user interface with flexible screen layout for increased productivity.
Specifications
  • Resolution: 0.8 nm at 15 kV, 0.9 nm at 1 kV.
  • Magnification: 20 to 2,000,000x.
  • Detectors: Includes UD, MD, LD, PD-BSED, and optional UVD.
  • Specimen Stage: 5-axis motor drive with a large chamber accommodating specimens up to 200 mm in diameter and 80 mm in height.
  • Image Display: Supports various pixel sizes and dual monitor operation.
Optional Accessories
  • Energy Dispersive X-ray Spectrometer (EDX)
  • Wavelength Dispersive X-ray Spectrometer (WDX)
  • Electron Backscattered Diffraction Detector (EBSD)
  • Cathodoluminescence System (CL)
  • Cryogenic Transfer System
See more

Catalog excerpts

SU7000 | Ultra high resolution Schottky SEM-1

Science Ring This logo symbolizes Scientific and Analytical instruments of Hitachi High-Tech Group. It is composed with an “S”, standing for "Science", our technology core competency, and with a ring that represents close connection we make with our customers. This “Science Ring” shows how we are committed to create new values by strengthening ties between Science and Society. Notice: For proper operation, follow the instruction manual when using the instrument. Specifications in this catalog are subject to change with or without notice, as Hitachi High-Technologies Corporation continues to develop the latest technologies and products for our customers. Copyright (C) Hitachi High-Technologies Corporation 2018 All rights reserved. ^Hitachi High-Technologies CorporationTokyo, Japanhttp://www.hitachi-hitec.com/global/em/ 24-14, Nishi-shimbashi,1-chome, Minato-ku Tokyo, 105-8717, Japan For technical consultation before purchase, please contact: [email protected] “ responsible sources Ultra-High-Resolution Schottky Scanning Electron Microscope

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SU7000 | Ultra high resolution Schottky SEM-2

The modern FE-SEM requires not only high performance but must also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection. The SU7000 is designed to address these aspects and more by delivering Enhanced information for diversified needs in the field of electron microscopy. Experience the nano-world with the SU7000! 1 Versatile Imaging Capability The SU7000 excels in fast acquisition of multiple signals to address expansive SEM needs, from imaging a wide...

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SU7000 | Ultra high resolution Schottky SEM-3

Imaging Performance Intuitive Graphical User Interface Enhanced information Acquisition Enhanced Signal Display The advanced detection system of the SU7000 streamlines acquisition of structural, topographical, compositional, crystallographic, and other types of information by minimizing changes to microscope conditions, such as working distance or accelerating voltage. ・Customizable display modes. ・Single and Dual-monitor configurations. ・Simultaneous image display up to 4-ch (single) and 6-ch (dual). ・Chamber Scope and SEM MAP for optical stage navigation. Surface micro-structural information...

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SU7000 | Ultra high resolution Schottky SEM-4

Specifications SU7000 The specimen chamber can accommodate a 9 200 mm or 80 mm tall specimen and 18 accessory ports. The large stage travels 135 mm (X) x 100 mm (Y) and can accept maximum 2 kg heavy specimen^*) Large specimen or variable type of sub-stages can be easily mounted on the front-opening large stage door. left: external view of the specimen chamber featuring 18 accessories ports Right: external view of the stage. XY movable range: 135 X 100 mm Left: Picture of the specimen captured by the camera equipped inside the chamber. Right: Camera image transferred to the SEM MAP screen for...

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.