Sample Preparation and Cross-Section Preparation

Argon ion Polishing Systems of the IM Series Energy systems Polymer fuel cell Ceramic fuel cell (La-Ce/NiO) CIGS solar cell Boron nitride Zinc coating on steel Carbon fibre reinforced plastic The clever alternative to FIB technology The IM series systems are indispensable for SEM sample preparation. They are ideal for when high-quality, millimetre-scale cross-sections or surfaces are needed and conventional mechanical preparation methods don’t give satisfactory results. The two systems IM4000 II and ArBlade 5000 are presented on the following pages. Cross-section preparation Surface polishing...

ArBlade 5000 / IM5000-CTC High-performance Ar+ ion polisher Product Features - Single, robust and maintenance-friendly Penning type ion gun with independent control of beam current and acceleration voltage. Allows intensive ion beams at all acceleration voltages (0-8kV) - Cross-section widths can be flexibly selected by periodically moving the sample relative to the ion beam from 1mm to 10mm wide Variable width cross-section due to lateral movement of the sample All extensions and additions from IM4000 are available. Plus exclusive IM5000 / IM5000 CTC additions: - Cross-sectional process depth...

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