RESISTANCE HiTESTER Component measuring instruments POWEH HIOKI HM354E RESISTANCE HiTESTER Q IINTI 10Qn iTWICiftDJl |HEHIJ _ f High-Speed Resistance Meters Optimized for Automated Systems The RM3542 and RM3542-01 Resistance HiTESTERs employ the four-termi- nal DC method to quickly and accurately measure the resistance of components such as resistors and ferrite bead inductors. Both models include advanced con- tact-check, comparator, and data export functions. The intuitive user interface and superb noise immunity are ideal for use with taping machines and separators. * including contact checking ISO 9001 ISO14001 H"^KI companv °vervfew> new products, environmental considerations ,.____ . and other information are available on our website.

Equipped with Contact Improver and contact check functions Reliable Resistance Measurement, Ideal for Automated Systems RESISTANCE HiTESTER RESISTANCE HiTESTER GUARD A LcuB LFOT High speed and accuracy maximize productivity Multiple checking functions ensure proper contact for reliable measurements. Low-power resistance mode measures chip inductors and EMC suppression components. Supports sample inspections during the manufacturing process1 7. Ultra high-speed and accurate resistance meter ideal for incorporation in automated systems. • Ultra Fast, Accurate Resistance Measurements Maximize Productivity...

Absolute Contact 2, Positive contact assures reliable measurements. • Always-On Contact Checking High-speed, reliable measurements are achieved by performing contact checks while measuring (instead of before and after, as Contact Check While Measuring • Detects probe bounce tance fluctuations while measuring • Minimizes contact time Contact Checking Before and After Measuring • Contact condition during not allowed during contact checking, speed is slow. Probe Bounce Contact Time Contact Time # Contact Improver Function Makes Reliable Contacts Quickly The "Contact Improver" function improves bad...

Ultra Fast and Accurate Resistance Measurement 3. HIOKI's core technology achieves ultra fast and accurate measurements. Fast Measurements with Excellent Reproducibility Scatter of Actual Measurement Data Comparison of actual data scatter at slow, medium and fast measurement speeds, showing only slight differences from the reproducibility of the slow setting. SLOW/MED/FAST Scatter Comparison Specified accuracy upper ' limit (SLOW setting) pecified accuracy lower ' limit (SLOW setting) Measurement Repetition (No. of Times) Minimal scattering achieves ultra-accurate resistance mea- surements suiting...

Meeting a Variety of Resistance Measurement Applications 4. Supports resistance measurements of chip inductors, EMC suppression components, and shunts. • Low-Power Resistance Measurement Mode Included For ranges from 1000 mCl to 1000 D., low-power resistance measurement is provided to minimize measurement current. Low-power resistance measurement provides accu- rate measurements using the thermal EMF compensation (OVC) function. Stable mea- surements are available even of components that are otherwise difficult to measure with high current, such as ferrite-bead and multilayer inductors*. * Inductors...

6. Engineered with the speed and accuracy required for automated systems i Total Productivity Supported by Fast and Accurate Measurements • Provides the speed and accuracy required for automated systems Contact to decision output in as little as 0.9 ms. Contact improve- ment, measurement and contact checking, and decision output are all completed within this interval. • All data can be imported in real time using the 38.4-kbps RS- • Model RM3542-01 also includes a GP-IB interface. Values in parenthesis are for 50 Hz (where timing depends on line frequency), units are in milliseconds Values in...

Multiple Test Fixture Options • Various fixtures available to suite the type of components to measure Noise-suppressing BNC-type measurement jacks are employed. Ready availability and easy assembly ensure smooth system setup. A variety of test fixtures for HIOKI LCR HiTESTERs can also be used. 4-TERMINAL PROBE 9140 TEST FIXTURE 9262 SMD TEST FIXTURE 9263 Cable length: 1 m Residual resistance: 10 mQ, or less Sample size: 1 to 10 mm Residual resistance: 10 mQ or less (1) Resistance Measurement (Low-Power OFF) [1-year accuracy (@23 ±5°C, 80% RH or less)] Resistance Measurement (Low-Power ON) [1-year...

*1. Settable for each range independently RESISTANCE HiTESTER RM3542-01 (with GP-IB interface) Test fixtures are not supplied with the unit. Select an optional test fixture when ordering. • Optional accessories TEST FIXTURE 9262 (direct connection type) SMD TEST FIXTURE 9263 (direct connection type) GP-IB CONNECTION CABLE 9151-02 (2m) 81 Koizumi, Ueda, Nagano, 386-1192, Japan http://www.hioki.co.jp / E-mail: [email protected] 6 Corporate Drive, Cranbury, NJ 08512 USA nttp://www.hiokiusa.com/ E-mail [email protected] Note: Company names and Product names appearing in this catalog are trademarks...