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HIOKI 3535 LCR HiTESTER

HIOKI 3535 LCR HiTESTER
8Pages

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Component measuring instruments Measure across the broad frequency range of 100kHz to 120MHz with the new Model 3535 LCR HiTESTER. The 6ms highspeed measurement capability is particularly useful with the builtin comparator and load functions, and for BIN (classification) measurements, to suit a wide range of applications such as chip inductor and high speed magnetic head testing, as well as other related research needs. Achieve ultimate measurement flexibility by detaching the head amp unit from the main unit and placing it in proximity to the test object so as to minimize the effect of test leads on measurements. The 3535's low price, ideal size and light weight are all achieved by incorporating an automatically balanced bridge circuit with digital control. Never before has such an advanced precision instrument coupled with economical features been placed on the test and measurement market. 3535 LCR HiTESTER HEAD AMP UNIT

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1 Detachable Head Amp The measurement frequency is set with four-digit resolution from 100 kHz to 120 MHz. Four sampling rates can be selected: FAST, NORMAL, SLOW and SLOW2. The minimum measurement time of about 6 ms (displaying |Z|) provides rapid sampling for optimum production line efficiency. (The measurement frequency range depends on the measured parameter type). The following parameters can be measured, and selected parameters can be captured using a PC. |Z|, |Y|, è, Rp, Rs (ESR), G, X, B, Lp, Ls, Cp, Cs, D (tanä) and Q. Measurement frequency, signal level and other conditions can be...

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EXT I/O Signals 2 ¡ EXT I/O Externally control triggering and loading of measurement conditions, and for automated lines, configure output signals including comparator results and end-of-measurement signals at the touch of a button. œ Outputs • Internal DC Power (+5 V output) • Comparator Results • BIN (Classification) Measurement Results • End-of-Measurement Signal œ Inputs • External DC Power Supply (+5 to 24 V can be provided by an external source) • External Trigger Signal • Selection of Panels for Loading The following chart shows the timing sequence of the trigger (TRIG),...

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Changing Settings While Measuring 3 Measurement Frequency Setting Screen Measurement Level Setting Screen Use the numeric keypad or digit keys to enter values for changing the test frequency or level while monitoring the measurement. Choose from open-circuit voltage or constant current mode for the level setting. Load Compensation Setting Screen Set up five compensation constants for the function to correct measurement values. Parameter Setting Screen Select any four of the fourteen parameter types for display. Menu Screen Select an item to display the corresponding setting screen. Initial...

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Multiple Functions for a Broad Range of Applications Application Setting Screen 4 Comparator BIN (Classification) Measurement Continuous Measurements Zoom Display Numeric Digit Display Scaling Compare two measurement items using the Comparator function. Input can be either the absolute value, percentage of standard value or its deviation percentage (Ä%). Classify 2 measurement items in up to 10 categories. Measurement conditions saved by the Panel Save function can be used to continuously measure up to five conditions per page. Enlarge the display of measurement data and comparator results....

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tr.row {} td.cell {} div.block {} div.paragraph {} .font0 { font:9.00pt "Arial", sans-serif; } .font1 { font:10.00pt "Arial", sans-serif; } .font2 { font:12.00pt "Arial", sans-serif; } .font3 { font:16.00pt "Arial", sans-serif; } .font4 { font:11.00pt "Times New Roman", serif; } .font5 { font:17.00pt "Times New Roman", serif; } .font6 { font:35.25pt "Times New Roman", serif; } High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development 3535 Spcifications Mcasurement Hema Z (irnnedaiiceX V (admittance). Rs (senes «luivalrtit lesutance. ESRX Rp (paiallel-quivalent...

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tr.row {} td.cell {} div.block {} div.paragraph {} .font0 { font:8.00pt "Arial", sans-serif; } .font1 { font:9.00pt "Arial", sans-serif; } .font2 { font:10.00pt "Arial", sans-serif; } .font3 { font:11.00pt "Arial", sans-serif; } .font4 { font:12.00pt "Arial", sans-serif; } .font5 { font:16.00pt "Arial", sans-serif; } .font6 { font:51.00pt "Arial Black", sans-serif; } .font7 { font:11.00pt "Franklin Gothic Medium", sans-serif; } .font8 { font:5.00pt "Times New Roman", serif; } 6 Measurement Accuracy and Range Accuracy Is calcultes uslng Z and 8, and other parameters are calculated from thse....

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7 3535 LCR HiTESTER 9151-02 GP-IB CONNECTION CABLE (2 m) 9151-04 GP-IB CONNECTION CABLE (4 m) 9442 PRINTER 9443-02 AC ADAPTER (for 9442, EU) 9443-03 AC ADAPTER (for 9442, USA) 9444 CONNECTION CABLE (for 9442) 1196 RECORDING PAPER (for 9442 / 25 m, 10 rolls) The Head Amp and Test Fixtures are not supplied with the unit. Please order the appropriate options for your application. œ Options 9700-10 HEAD AMP UNIT 9677 SMD TEST FIXTURE 9699 SMD TEST FIXTURE 9678 CONNECTION CABLE 9637 RS-232C CABLE (9pin-9pin/cross/1.8m) 9638 RS-232C CABLE (9pin-25pin/cross/1.8m) Options Head Amp Unit must be...

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HIOKI 3535 LCR HiTESTER 8Pages

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HIOKI 3535 LCR HiTESTER
8Pages