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HIOKI 3504 Series C HiTESTERs

HIOKI 3504 Series C HiTESTERs

HIOKI 3504 Series C HiTESTERs

Product catalog summary
Overview: The C HiTESTER series, including models 3506, 3505, 3504-60, 3504-50, and 3504-40, are high-speed, high-accuracy electronic measuring instruments designed for capacitance measurements, particularly suitable for high-capacitance MLCCs. They offer measurement intervals as fast as 2 ms.
Specifications:
  • Models 3506 and 3505 operate at frequencies of 1 kHz and 1 MHz, with the 3505 also supporting 100 kHz. Models 3504-60, 3504-50, and 3504-40 operate at 120 Hz and 1 kHz.
  • Measurement accuracy is enhanced for low capacitance with repeatability features.
  • Contact-checking functions include Low-C Reject and Detection Level Monitoring.
Features:
  • High-speed measurements with intervals as fast as 2 ms.
  • Bin function for sorting measurement values into ranks.
  • Comparator function with upper and lower limit settings for parameters.
  • Memory function for storing up to 32,000 measurements, depending on the model.
  • Intuitive operation with LED indicators and trigger-synchronous output to minimize contact wear.
  • External I/O capabilities for interfacing with automated devices.
Performance:
  • Enhanced repeat-measurement accuracy for very low-capacitance measurements.
  • Self-calibration and cable-length-compensation functions to minimize errors.
  • Contact-checking functions to detect errors during measurement, improving yield rates.
Interfaces:
  • RS-232C and GP-IB interfaces for computer control and data handling.
  • EXT I/O for external control of measurement conditions and output of results.
Applications: Suitable for high-speed testing environments, such as taping machines, and for both low and high capacitance measurements.
Compliance: Complies with JIS C 5101-1 standards for C-Meter measurement frequencies.
Functional Differences:
  • 3504-60: Includes four-terminal contact-checking and constant voltage measurement at 100 mV, 500 mV, and 1 V.
  • 3504-50: Similar to 3504-60 but without the four-terminal contact-checking function.
  • 3504-40: Lacks GP-IB interface and Bin function.
Additional Features:
  • Chatter Detection: Detects contact bounce.
  • Memory Function: Stores up to 32,000 measurement values.
  • Comparator and BIN Measurement: Provides HI/IN/LO evaluations and 14 ranks for BIN measurement.
  • Printer Function: Optional Printer 9442 for printing measurement values.
Measurement Accuracy: Detailed equations and coefficients are provided for calculating measurement accuracy based on signal level, speed, cable length, and temperature.
Accessories and Options: Includes various probes, test fixtures, and connection cables for different measurement needs.
Applicable Standards: EMC: EN61326, EN61000-3-2, EN61000-3-3; Safety: EN61010-1.
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Catalog excerpts

HIOKI 3504 Series C HiTESTERs-1

C HiTESTER 3506, 3505 C HiTESTER 3504-60, 3504-50, 3504-40 Electronic measuring instruments For Low Capacitance C HiTESTER 3506 Measures at 1 kHz and 1 MHz C HiTESTER 3505 Measures at 1 kHz, 100 kHz and 1 MHz For High Capacitance MLCCs C HiTESTERs 3504 -60, 3504 -50 and 3504 -40 Measures at 120 Hz and 1 kHz Ideal C meters for sorting and testing High-Speed Measurements Measurement intervals as fast as 2 ms Specifically, the 3504 Series performs constant-voltage measurements of high-capacitance MLCCs in 2 ms. High Accuracy Models 3505 and 3506 have greatly improved repeatability accuracy for very low capacitance measurements. Contact-Checking Functions Use Low-C Reject and Detection Level Monitoring functions to verify contact integrity between measurement electrodes and objects to be measured. Model 3504-60 provides four-terminal contact checking.

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HIOKI 3504 Series C HiTESTERs-3

2 n High-speed measurements as fast as 2 ms (1 ms for analog measurements) High-speed testing such as with taping machines is supported by the 2 ms minimum measurement time (except FAST 120 Hz measurements). Select from FAST, NORMAL and SLOW measurement speeds. 3506, 3505 Measurement Speed Measurement Frequency Output Signal FAST NORMAL SLOW INDEX 1.1 ms 4.1 ms 13.3 ms EOM 2 ms 5 ms 14 ms 1 kHz 100 kHz 1 MHz 3504 -60, 3504 -50, 3504 -40 Measurement Speed Measurement Frequency Output Signal FAST NORMAL SLOW INDEX 8.3 ms 33.3 ms 133.3 ms EOM 10 ms 37.5 ms 146 ms INDEX 1 ms 4 ms 24 ms EOM 2 ms 5.5...

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HIOKI 3504 Series C HiTESTERs-4

3 C HiTESTER 3506, 3505 Measure low-magnitude capacitors with high accuracy •Measurement parameters and frequency ranges Measurement Frequencies Range of Measurements (C, D) 120 Hz C: 0.000 fF to 15.0000 µF 3506 D: 0.00001 to 1.99999 1 kHz C: 0.000 fF to 15.0000 µF 1 MHz - - 3505 D: 0.00001 to 1.99999 100 kHz - Features of Models 3506 and 3505 C HiTESTERs n Enhanced repeat-measurement accuracy 3505 NORMAL (5 ms) Previous model FAST (5 ms) 100 60 40 20 80 0 60 −0.02% −0.01% −0.00% 0.01% 0.02% Capacitance Measurement Repeatability Accuracy 40 20 0 .3 2 −0 5% .2 7 −0 5% .2 2 −0 5% .1 7 −0 5% .1...

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HIOKI 3504 Series C HiTESTERs-5

4 C HiTESTER 3506, 3505 S n pecifications Measurement frequencies 1 kHz, 100 kHz (only Model 3505) and 1 MHz Accuracy: ±0.01% or better Frequency shift: 1 MHz ±1%, ±2% Measurement signal level Open-circuit terminal voltage: 500 mV or 1 V Signal level accuracy: ±10% ±5 mV Output resistance: Approx. 1Ω (@1 kHz in 2.2 μF and higher ranges; @100 kHz in the 22 nF and higher ranges), approx. 20 Ω (in ranges other than the above) C: 0.000 fF to 15.0000 μF Range of measureable D: 0.00001 to 1.99999 values Q: 0.0 to 19999.9 Equivalent circuit mode Series-Parallel Equivalent Circuit mode (Auto/Manual)...

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HIOKI 3504 Series C HiTESTERs-6

5 C HiTESTER 3504-60, 3504-50 and 3504-40 Perform high-speed, constant-voltage testing even of high-capacitance MLCCs •Measurement parameters and frequency ranges Range of Measurements (C, D) Measurement Frequencies 120 Hz 1 kHz 100 kHz 1 MHz - - 3504-60 C: 0.9400 pF to 20.0000 mF 3504-50 D: 0.00001 to 1.99999 3504-40 •Functional differences between Models 3504 Constant-Voltage Measurement (CV) 100mV 500mV 1V -60, 3504-50 and 3504-40 Four-Terminal Interface Bin Contact Check Function Function RS-232C GP-IB EXT I/O 3504-60 3504-50 - - 3504-40 - - - - Features of Model 3504-60, 3504-50 and 3504-40...

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HIOKI 3504 Series C HiTESTERs-7

6 C HiTESTER 3504-60, 3504-50 and 3504-40 Measurement accuracy and range Temp. and humidity for guaranteed accuracy: 23°C ±5%, 80% RH or less (non-condensating) Warm-up time: 1 h, with open- and short-circuit compensation n Measurement area: C: 0.9400 pF to 20.0000 mF; D: 0.00001 to 1.99999 n Measurement accuracy n Basic accuracy [Guaranteed accuracy: 6 months when D ≤ 0.1 D] Range No. Use the following equation to calculate the measurement accuracy. 1 Measurement accuracy = basic accuracy × B × C × D × E 2 [B: Measurement signal level coefficient] 1 at 1 V and at 500 mV, 1.5 at 100 mV 3 4 [C:...

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HIOKI 3504 Series C HiTESTERs-8

Options for a wide range of applications Test sample dimensions: 1 to 10 mm Test sample dimensions: 3.5 ± 0.5 mm Test sample dimensions: 1.0 to 4.0 mm wide, maximum 1.5 mm high Measurement values, comparator results, and BIN measurement results can be printed out on the optional Printer 9442 via the standard RS-232C Interface. This Is convenient If you want to attach Inspection results to printed data. (The optional Connection Cable 9444 and AC Adapter are required to connect the • Printing method: Thermal serial dot printer • Power supply: AC Adapter 9443 or supplied NIMH battery (prints 3000...

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