Exicor OIA
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BIREFRINGENCE MEASUREMENT Exicor OIA PRODUCT BULLETIN THE PREMIER BIREFRINGENCE MEASUREMENT The system utilizes PEMs to modulate the polarization state SYSTEM FOR OBLIQUE ANGLE EVALUATION OF of a light beam and advanced detection and demodula- LENSES, PARALLEL FACED, AND CURVED OPTICS! tion electronics to measure how an optic has changed the polarization state. This results in the measurement of optical retardation of one polarization state relative to another at 90°. Birefringence and Fast Axis orientation, as well as theoretical residual stress, can be evaluated with this data. The Hinds Instruments Exicor OIA is the Premier Birefringence Measurement System for the evaluation of Lenses, Parallel Faced Optics and Curved Optics at normal and oblique incident angles. The system is built on Hinds Instruments award winning Photoelastic Modulator (PEM) based Exicor® Birefringence Measurement technology. This next generation Hinds Instruments and the Exicor Oblique Incident Angle Technology have been selected to evaluate optical birefringence in research and production by the world leaders in lithographic lens blanks and finished lenses. Our systems are surpassed by none! birefringence measurement system is providing the industry with new

BIREFRINGENCE MEASUREMENT Exicor OIA PRODUCT BULLETIN System Description: Three Beam Axis measurement solution with precision flat ceramic reference frame, X,Y, Sample Stage, Source and Detector motion axis’s Beam AXIS 1 – OIA DUV193 or OIA VIS633  Exicor OIA Software  Automatic scan of Parallel flats and Spherical lens types For Oblique Incident Angle evaluations of lenses and parallel faced  Asphere can be scanned with Manual macro program optics. This axis utilizes 193nm Source and Detector modules or  2D Maps of retardation and fast Axis orientation 632.8nm HeNe Source and Detector...