Exicor® MT
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BIREFRINGENCE MEASUREMENT Exicor® MT PRODUCT BULLETIN The MT Systems are the modular units of the Exicor® needs of industry. These systems are all easily adapted to birefringence measurement system family of products. The your requirements and the demands of your application MT systems are only sold to OEM customers who buy in environment. The Exicor NEXUS programTM is available to volume and direct from the factory. These models are widely help you integrate or develop processes using the Exicor used in industry to measure components such as thin glass, plastic films, bulk material, fibers, and many others. General Systems Features: Exicor MT The Exicor MT is designed for low level birefringence and stress birefringence measurements. This system is focused on thin glass, thick plastic and thin plastic films applications where low level resolution and repeatability are required to produce high tech materials and products.  or UI software (2D and 3D graphical representation of DLL birefringence parameters)  Modular Design (Flexible mounting options for quick and custom integration)  Well-suited for production line applications Exicor MT-3 The Exicor MT-3 is designed for higher level birefringence applications up to half wave of the probe light. This system is focused on thick plastic and thin plastic films applications where low level to mid-level birefringence needs to be evaluated in one instrument. Exicor MT-4 The Exicor MT-4 is designed to measure high levels of birefringence. This system is focused on plastic films and applications where retardation levels exceed the half wave value of the probe light. This system uses a unique, patented dual wavelength and orientation technique to measure birefringence magnitudes up to 4000 nm. Exicor MT-5 The Exicor MT-5 is an integrated multi-source and multidetector system. It is designed for web applications where multiple fixed measurement points are needed and traversing stages are either impractical or not an option. Exicor MT-Custom The MT family is designed to fully adapt to the demanding

BIREFRINGENCE MEASUREMENT Exicor® MT PRODUCT BULLETIN Retardation Range: Repeatability1: Angular Resolution / Repeatability1: Measurement Rate4: Light Source Wavelength5: Measurement Spot Diameter6: Measurement Units: Typical performance at 5nm retardation Up to 0.8 nm, 1% thereafter 3 Up to 1.5 nm, 1% thereafter 4 Custom wavelengths available 5 Spot sizes of less than 1mm native require optional high resolution detector module 1 2  Additional Polarization Parameters  Spectroscopic and RGB measurements  Custom wavelengths (VIS, NIR)  Custom mounting brackets  Custom Software (UI or...