Exicor® GEN Series

Product catalog summary

Overview
The Exicor® GEN Series is a product line designed for ultra-low retardation measurements in polarization technology. It is recognized for its award-winning reliability and precision in measuring birefringence.

Significant Features

Unprecedented sensitivity in low-level birefringence measurement.
Simultaneous measurement of birefringence magnitude and angle.
Precision repeatability and high-speed measurement capabilities.
No moving parts in the optical system, enhancing reliability.
Automatic mapping of variable-sized optical elements.
Utilizes photoelastic modulator technology for enhanced performance.
User-friendly operation for ease of use.

Applications

Quality control metrology.
Low-level birefringence measurements in display glass, LCDs, large irregular shaped planar glass, and plastic films.

System Options

Scan In Motion (SIM).
Keep Out Barrier.
Manual or Auto Tilt Stage.
Thickness and Warpage Sensors available on GEN5 or GEN6 models.

Technical Specifications

Retardation Range: 0.005nm to 300 nm.
Resolution: 0.001 nm.
Repeatability: ±0.01 nm for retardation < 1 nm or ± 1% for retardation > 1 nm.
Angular Resolution/Repeatability: 0.01° / ± 0.05°.
Measurement Time: Up to 10 pps.
Wavelength: 632.8 nm, with custom wavelengths available.
Spot size: Approximately 1 mm typical.
Demodulation Analysis Technique: Hinds Instruments SignalocTM Lock-in Amplifiers.
Measurement Units: nm (retardation), ° (angle).
Maximum Sample Size and Scan Area vary by model, with the largest being 3000 x 3200 mm for GEN10.

Contact Information
Hinds Instruments, Inc., located at 7245 NE Evergreen Pkwy, Hillsboro, OR 97124, USA. For inquiries, contact via phone at 503.690.2000 or email at [email protected].

Catalog excerpts

exicor systems Exicor® GEN Series PRODUCT BULLETIN Exicor GEN Series Ultra-low retardation measurements. Award Winning. Reliable. Technology for Polarization Measurement

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exicor systems Exicor® GEN Series PRODUCT BULLETIN Applications  Quality control metrology  Low-level birefringence measurements of  Display glass Signiﬁcant Features  Unprecedented sensitivity in low-level birefringence measurement  Simultaneous measurement of birefringence magnitude and angle  Large irregular shaped planar glass and plastic System Options  Scan In Motion (SIM)  No moving parts in the optical system  Photoelastic modulator technology  Manual or Auto Tilt Stage  Simple, user-friendly operation  Automatic mapping of variable-sized optical elements  Thickness and Warpage...

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exicor systems Exicor® GEN Series PRODUCT BULLETIN Retardation Range Resolution Angular Resolution/Repeatability Measurement Time Wavelength Spot size ~ 1 mm typical Hinds Instruments SignalocTM Lock-in Ampliﬁers Demodulation Analysis Technique Measurement Units Maximum Sample Size (mm) Maximum Scan Area (mm) Typical performance at 5nm Retardation Maximum data collection speed. Sample XY scan time dependent on stage movement parameters. 3 Custom wavelengths available 1 2 GEN System Glass Measurements GENERATION GLASS SIZE Hinds Instruments, Inc | 7245 NE Evergreen Pkwy | Hillsboro, OR 97124 |...

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Exicor® GEN Series

Exicor® GEN Series

Catalog excerpts

All Hinds Instruments catalogs and technical brochures