exicor systems Exicor® GEN Series PRODUCT BULLETIN Exicor GEN Series Ultra-low retardation measurements. Award Winning. Reliable. Technology for Polarization Measurement

exicor systems Exicor® GEN Series PRODUCT BULLETIN Applications  Quality control metrology  Low-level birefringence measurements of  Display glass Significant Features  Unprecedented sensitivity in low-level birefringence measurement  Simultaneous measurement of birefringence magnitude and angle  Large irregular shaped planar glass and plastic System Options  Scan In Motion (SIM)  No moving parts in the optical system  Photoelastic modulator technology  Manual or Auto Tilt Stage  Simple, user-friendly operation  Automatic mapping of variable-sized optical elements  Thickness and Warpage...

exicor systems Exicor® GEN Series PRODUCT BULLETIN Retardation Range Resolution Angular Resolution/Repeatability Measurement Time Wavelength Spot size ~ 1 mm typical Hinds Instruments SignalocTM Lock-in Amplifiers Demodulation Analysis Technique Measurement Units Maximum Sample Size (mm) Maximum Scan Area (mm) Typical performance at 5nm Retardation Maximum data collection speed. Sample XY scan time dependent on stage movement parameters. 3 Custom wavelengths available 1 2 GEN System Glass Measurements GENERATION GLASS SIZE Hinds Instruments, Inc | 7245 NE Evergreen Pkwy | Hillsboro, OR 97124 |...