Exicor® 250AT
2Pages

{{requestButtons}}

Catalog excerpts

Exicor® 250AT - 1

BIREFRINGENCE MEASUREMENT Exicor® 250AT PRODUCT BULLETIN The 250AT is the ‘Step-up’ model of the Exicor® birefringence measurement system family of products. This model was developed to replace the obsolete Exicor 350AT and is widely used for lighter weight but larger samples such as plastic films. Built on the Exicor 150AT frame, this system incorporates a larger scan area (up to 250mm x 250mm) while maintaining the desk top nature of the Exicor 150AT system. This is also the system most customers select when they choose the Exicor ATS (spectroscopic measurements) option for studying Features:  250mm Automated XY stage  and 3D graphical representation of birefringence 2D parameters  Large and Flexible stage platform design for adding custom parts holders or process aids  Advanced data analysis features included standard in user interface birefringence at different wavelengths. The larger stage size also allows for loading multiple small parts on the stage and in conjunction with the optional Exicor Macro+ software to execute automated routines to scan each part individually. The user can begin the routine and let it run for multiple shifts, overnight or even longer (depending on the application) without having to intervene. With two measurement range options available to choose from (High Sensitivity and Extended Range), the system is well suited to address the demanding requirements of your larger light weight samples. The optional high speed scanning package makes high spatial resolution scans (<1mm grid spacing) practical.

Open the catalog to page 1
Exicor® 250AT - 2

BIREFRINGENCE MEASUREMENT Exicor® 250AT PRODUCT BULLETIN HIGH SENSITIVITY Retardation Range: EXTENDED RANGE up to 100 pps / sample size dependent Modulation Technique / Frequency PEMLabsTM Photoelastic Modulator / 50 kHz and 50/60 kHz Demodulation Analysis Technique: Hinds Instruments SignalocTM Lock-in Amplifier or Waveform Capture Card Measurement Units: Typical performance at 5nm retardation Up to 0.8nm, 1% thereafter 3 Up to 1.5nm, 1% thereafter 4 Maximum data collection speed. Sample XY scan time dependent on stage movement parameters 5 Custom wavelengths available 6 Spot sizes of less...

Open the catalog to page 2

All Hinds Instruments catalogs and technical brochures

  1. Exicor® MT

    2 Pages

  2. Exicor OIA

    2 Pages