BIREFRINGENCE MEASUREMENT Exicor® 120AT PRODUCT BULLETIN The new Exicor 120AT is versatile enough to excel in both production floor and R&D lab environments. The bench top design and intuitive automated scanning software make this product ideal for day-in-day-out evaluation of small parts (up to 120 mm x 100 mm). The standard high speed scanning package, Scan in Motion™ or SIM, makes high spatial resolution scans (<1 mm grid spacing) practical. Applications  Quality control metrology  Low-level birefringence measurements of     Plastic Films Lens Blanks Laser Crystals Cell Phone Display Windows Significant Features  Unprecedented sensitivity in low-level birefringence measurement  Simultaneous measurement of birefringence magnitude and angle  Precision repeatability  High-speed measurement  No moving parts in the optical system  Automatic mapping of variable-sized optical elements  Simple, user-friendly operation

BIREFRINGENCE MEASUREMENT Exicor® 120AT PRODUCT BULLETIN Retardation Range: Retardation Resolution /Repeatability Angular Resolution /Repeatability : 3 Measurement Rate / Time : System Dimensions: Light Source Wavelength 5: Measurement Spot Diameter : Measurement Units: 1 Typical performance at 5 nm retardation 2 Up to 2nm, 1% thereafter 3 Typical performance at 10nm retardation 4 Maximum data collection speed. Sample XY scan time dependent on stage movement parameters. 5 Custom wavelengths available 6 Spot sizes of less than 1 mm require optional high resolution detector module       ...