Birefringence Measurement
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exicor systems Birefringence Measurement PRODUCT BULLETIN Exicor® birefringence measurement technology, introduced in 1999 with the model 150AT, provides leading edge customers with the world’s most technically advanced, production-worthy capability for measuring birefringence. Unprecedented sensitivity in the Exicor systems is a product allowing sequential measurements from the two signal channels. The data is analyzed, and then retardation magnitude and axis angle are displayed and stored in a file. When operated in the automated mapping mode, the x-y translation stage will move the sample to the next predetermined measurement location. Results are displayed instantaneously in user-specified formats. of Hinds Instruments’ PEMLabs™ Technology that pioneered the ultra-low birefringence photoelastic modulator (PEM). The award winning sensitivity of Exicor is enhanced by the modulation purity of the PEM, a result of the resonant nature of the modulator. The modulation frequency of the PEM is 50 kHz, providing fast measurement capability. The unique design of the dual detector optical system, in conjunction with PEM science, provides a valued feature: no moving parts in the optical system. The absence of moving components produces high mechanical reliability as well as repeatability of measurements and allows magnitude and angle to be measured simultaneously. Exicor measures retardation integrated along an optical path through the optical sample under investigation. It is designed to measure and display both the magnitude and orientation of the retardation axis. A unique design (patents pending) eliminates moving parts in the optical train and avoids the necessity to switch between measurement angles. A HeNe laser beam is polarized and then modulated by the PEM. The modulated beam is transmitted through the sample and divided by a beam-splitting mirror. Each beam passes through a combination of an analyzer, optical filter, and photodetector. The electronic signals are processed through a lock-in amplifier that provides very low level signal detection. A software algorithm, developed by Hinds Instruments, converts the signal levels

exicor systems Birefringence Measurement PRODUCT BULLETIN THE EXICOR STORY For years, crossed polarizers represented the state-ofthe-art in birefringence measurement that was available to researchers as well as quality control professionals. While this 1 or 2 nm level of sensitivity was sometimes sufficient, “pixel” quantification, metrology level repeatability and statistical data analysis capabilities were missing. Scientists at Hinds Instruments, drawing on more than two decades experience with photoelastic modulation technology, applied this relatively fast (50 kHz), non-mechanical,...

exicor systems Birefringence Measurement PRODUCT BULLETIN BIREFRINGENCE MEASUREMENT SYSTEM SPECIFICATIONS High Sensitivity Extended Range Measurement Rate/Time Fast Axis Angle Spot Size Contact Hinds Contact Hinds Contact Hinds Contact Hinds Contact Hinds Contact Hinds Contact Hinds Up to 0.8 nm, 1% thereafter Up to 1.5 nm, 1% thereafter 3 Up to 2.5 nm, 1% thereafter 1 2 Hinds Instruments, Inc | 7245 NW Evergreen Pkwy | Hillsboro, OR 97124 | USA T: 503.690.2000 | Fax: 503.690.3000 | sales@hindsinstrument