Catalog excerpts
FISCHERSCOPE® X-RAY XAN® 250 FISCHERSCOPE® X-RAY XAN® 252 High Performance X-Ray Fluorescence Measuring Instruments for fast and non-destructive Material Analysis and Coating Thickness Measurement | Coating Thickness |,|| Material Analysis |^| Microhardness Material Testing
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FISCHERSCOPE® X-RAY XAN® 250/252 Description The FISCHERSCOPE X-RAY XAN 250 and XAN 252 are high performance, compact and universally applicable x-ray measuring instruments. They are well suited for the non-destructive coating thickness measurement and material analysis. The XAN 250 and XAN 252 instruments are especially well suited for measuring and analyzing thin coatings, even with very complex compositions or small concentrations. Typical fields of application: • Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries • Trace...
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General Specification Intended use Element range Design Measuring direction X-Ray Source X-ray tube High voltage Aperture (Collimator) Primary filter Measurement spot X-Ray Detection X-ray detector Resolution (fwhm for Mn-Ka) Measuring distance Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, trace elements and alloys Aluminum (13) to Uranium (92) - up to 24 elements simultaneously Bench top unit with upwards opening hood Bottom up Micro-focus tungsten tube with beryllium window Three steps: 10 kV, 30 kV, 50 kV 4x changeable: 0 0.2 mm (7.9 mils),...
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FISCHERSCOPE® X-RAY XAN® 250/252 External dimensions Width x depth x height Environmental Conditions Operating temperature Storage/Transport temperature Evaluation unit Computer Standard: Fischer WinFTM® BASIC including PDM®, Optional: Fischer WinFTM® SUPER X-Ray standards Fully protected instrument with type Individual acceptance inspection as a approval according to the German fully protected instrument according to regulations „Deutsche Röntgen- the German regulations „Deutsche Order FISCHERSCOPE X-RAY XAN 250 604-776 Special XAN product modification and technical consultation on request...
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